Abstract:The modern industrial environment is equipping myriads of smart manufacturing machines where the state of each device can be monitored continuously. Such monitoring can help identify possible future failures and develop a cost-effective maintenance plan. However, it is a daunting task to perform early detection with low false positives and negatives from the huge volume of collected data. This requires developing a holistic machine learning framework to address the issues in condition monitoring of high priori… Show more
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