2015
DOI: 10.1186/s11671-015-1118-6
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Conductance Quantization in Resistive Random Access Memory

Abstract: The intrinsic scaling-down ability, simple metal-insulator-metal (MIM) sandwich structure, excellent performances, and complementary metal-oxide-semiconductor (CMOS) technology-compatible fabrication processes make resistive random access memory (RRAM) one of the most promising candidates for the next-generation memory. The RRAM device also exhibits rich electrical, thermal, magnetic, and optical effects, in close correlation with the abundant resistive switching (RS) materials, metal-oxide interface, and mult… Show more

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Cited by 93 publications
(100 citation statements)
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“…[14] To avoid randomness and to tolerate fluctuation in practical materials, quantum conductance in memristors is often confirmed by the peaks at integer multiples of G 0 in statistical analysis on plenty of experimental data (Figure 5b). [71] Adv. [71] Adv.…”
Section: Experimental Phenomenamentioning
confidence: 99%
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“…[14] To avoid randomness and to tolerate fluctuation in practical materials, quantum conductance in memristors is often confirmed by the peaks at integer multiples of G 0 in statistical analysis on plenty of experimental data (Figure 5b). [71] Adv. [71] Adv.…”
Section: Experimental Phenomenamentioning
confidence: 99%
“…Among them, one representative is the n-Si/SiO x /p-Si memristor with statistical conductance peaks from 0.5 to 4.5G 0 with the interval of 0.5G 0 (Figure 5e). [70,74] Unexpectedly, [71] Copyright 2015, The authors, published by Springer. Moreover, it is noteworthy that a low voltage sweeping rate to slow down the size evolution process of conducting filaments is usually necessary to observe quantum conductance in memristors.…”
Section: Wwwadvelectronicmatdementioning
confidence: 99%
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“…[20][21][22] Exploration of the quantized conductance of APCs in memristors can date back to 2005, when Aono and coworkers first demonstrated conductance quantization in solid electrolyte-based atomic switch devices. [27][28][29] Nevertheless, the basic understanding about the essence of local ion rearrangement and APC evolution dynamics is still inadequate, from aspects of both materials design and fundamental physics. For instance, both metal cations and oxygen anions are utilized to construct APCs through their migration, local rearrangement, and electrochemistry in insulating matrix of SiO x , ZnO, ZrO x , HfO x , TiO x , TaO x , polyethylene oxide (PEO), amorphous carbon, etc.…”
Section: Introductionmentioning
confidence: 99%
“…[6] Electronic switches with atomicsized functional building blocks are the main driving force of modern nanotechnology. [6] Electronic switches with atomicsized functional building blocks are the main driving force of modern nanotechnology.…”
mentioning
confidence: 99%