Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

Kelley, Tommie W.; Granstrom, Eric L.; Frisbie, C. Daniel

doi:10.1002/(sici)1521-4095(199903)11:3<261::aid-adma261>3.0.co;2-b

Cited by 213 publications

(151 citation statements)

References 13 publications

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“…Conductive probe atomic force microscopy (CP-AFM) was found to be a very powerful tool for nanoscale electrical characterization in general, and for molecular electronics in particular. [24][25][26][27] This technique enables the study of several parameters that affect the spin dependent electron transfer or the overall electron transfer, in a relatively simple manner. The same concept was applied in the past both with CP-AFM and STM for investigating length dependent [28][29][30][31][32] and force dependent conduction.…”

Section: Introductionmentioning

confidence: 99%

Structure dependent spin selectivity in electron transport through oligopeptides

Kiran

Cohen

Naaman

2016

The Journal of Chemical Physics

108

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The chiral-induced spin selectivity (CISS) effect entails spin-selective electron transmission through chiral molecules. In the present study, the spin filtering ability of chiral, helical oligopeptide monolayers of two different lengths is demonstrated using magnetic conductive probe atomic force microscopy. Spin-specific nanoscale electron transport studies elucidate that the spin polarization is higher for 14-mer oligopeptides than that of the 10-mer. We also show that the spin filtering ability can be tuned by changing the tip-loading force applied on the molecules. The spin selectivity decreases with increasing applied force, an effect attributed to the increased ratio of radius to pitch of the helix upon compression and increased tilt angles between the molecular axis and the surface normal. The method applied here provides new insights into the parameters controlling the CISS effect. C 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license

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Section: Introductionmentioning

confidence: 99%

Structure dependent spin selectivity in electron transport through oligopeptides

Kiran

Cohen

Naaman

2016

The Journal of Chemical Physics

108

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“…CSFS-AFM evaluations were performed to establish and identify the surface profile and simultaneously obtain typical topographical, tunnelling and current/voltage properties of the developed and exfoliated ultra-thin Q2D WO 3 nanoflakes [26][27][28][29]. This procedure was done using Bruker MultiMode-8 Atomic Force System with installed Peak Force TUNA module (model: MM8-PFTUNA for MultiMode8 AFM system, Germany).…”

Section: Structural and Physical-chemical Characterisationmentioning

confidence: 99%

Mechanically exfoliated ultra-thin WO3 nanostructures: study of their enhanced electrical properties

Zhuiykov

Kats

2014

Ionics

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Ultra-thin orthorhombic β-WO 3 nanoflakes were prepared by two-step sol-gel-exfoliation method and sintered at 550 and 650°C, respectively. Their morphology and electrical properties were investigated by the following material characterisation techniques: energy-dispersive X-ray spectroscopy (EDX), scanning electron microscopy (SEM), current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce TUNA™), Fourier transform infra-red absorption spectroscopy (FTIR), linear sweep voltammetry (LSV) and Raman spectroscopy. CSFS-AFM analysis exhibited good correlation between the topography of the developed nanostructures and various features of WO 3 nanoflakes. It was found that β-WO 3 nanoflakes annealed at 550°C possess distinguished and exceptional thickness-dependent properties in comparison with the bulk, microstructured and nanostructured WO 3 synthesized at alternative temperatures.

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“…In C-AFM, a cantilever-type conductive probe connected to a current amplifier is used to record the local conductivity of the sample, while the topography is recorded via the mechanical deflection of the cantilever. Since its invention, C-AFM has been successfully applied in the electrical characterization of a large variety of small-scale systems such as carbon nanotubes [3], semiconductor nanowires [4], self-assembled molecular monolayers [5] and organic layers [6], to cite just a few examples.…”

Section: Introductionmentioning

confidence: 99%

Quartz tuning fork-based conductive atomic force microscope with glue-free solid metallic tips

Botaya

Otero

González

et al. 2015

Sensors and Actuators A: Physical

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Conducting Probe Atomic Force Microscopy: A Characterization Tool for Molecular Electronics

Cited by 213 publications

References 13 publications

Structure dependent spin selectivity in electron transport through oligopeptides

Structure dependent spin selectivity in electron transport through oligopeptides

Mechanically exfoliated ultra-thin WO3 nanostructures: study of their enhanced electrical properties

Quartz tuning fork-based conductive atomic force microscope with glue-free solid metallic tips

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