Oxidative chemical vapor deposition (oCVD) is an efficient technique to produce highly conductive films of Poly (3,4-ethylenedioxythiophene) (PEDOT). Despite numerous studies on the oCVD of PEDOT films, there is limited information on the stability of the sublimation of solid oxidants and on their impact on the polymerization reactions. In this work, we use an in situ Quartz Crystal Microbalance to monitor film formation over time. Through a series of deposition experiments between 20 °C and 100 °C and for FeCl3/EDOT molar gas ratios between 17.3 and 75.3, we analyze in detail the correlations between process parameters and film morphology, composition, surface topography and electrical conductivity on 10 cm silicon wafers. By using multiple substrates at different positions into the reactor, we demonstrate that the formation of PEDOT occurs uniformly through purely surface reactions, following step growth polymerization principles. These results pave the way towards highly conductive oCVD PEDOT films processed from convenient solid oxidants.