Contactless network analysis system for the calibrated measurement of the scattering parameters of planar two-port devices

Zelder, T.; Geek, B.; Wollitzer, M.; Rolfes, Ilona; Eul, H.

doi:10.1109/eumc.2007.4405172

Cited by 9 publications

(4 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The implementation of the contactless vector network analysis reveals difficulties due to the reproducibility of the positioning of the contactless probes. Therefore, printed loops and conventional on-wafer probes are used as coupling structures in [8], whereby measurement results are shown up to 2 GHz. In comparison to [8], different modified printed loop couplers are investigated for contactless measurements up to 20 GHz in this paper.…”

Section: Introductionmentioning

confidence: 99%

“…Therefore, printed loops and conventional on-wafer probes are used as coupling structures in [8], whereby measurement results are shown up to 2 GHz. In comparison to [8], different modified printed loop couplers are investigated for contactless measurements up to 20 GHz in this paper. Furthermore, two different possibilities of extracting coupled power from the printed loops will be discussed.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Contactless Vector Network Analysis With Printed Loop Couplers

Zelder

Geck

Wollitzer

et al. 2008

IEEE Trans. Microwave Theory Techn.

View full text Add to dashboard Cite

In this paper, an introduction to contactless vector network analysis is given. Furthermore, the implementation of a contactless measurement setup is presented using different printed coupling structures. The coupling structures are connected to a vector network analyzer (VNA) by means of conventional on-wafer probes, as well as planar-coaxial transitions. For the contactless method, conventional calibration algorithms are used to determine the scattering parameters of a device within a complex planar circuit. The contactless measured results are compared to results received with a conventional VNA and to simulation results obtained with a 3-D field simulator. These comparisons show that, especially for small coupling structures of approximately 1 mm, the results correspond well up to 20 GHz.Index Terms-Calibration technique, contactless scattering-parameter measurement, electromagnetic probe, microwave circuit testing, vector network analyzer (VNA).

show abstract

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Contactless Vector Network Analysis With Printed Loop Couplers

Zelder

Geck

Wollitzer

et al. 2008

IEEE Trans. Microwave Theory Techn.

View full text Add to dashboard Cite

show abstract

“…A promising method is the contactless vector network analysis proposed by Stenarson et al (2001), Zelder et al (2007a). A simplified two-port setup of this contactless measurement technique is illustrated in Fig.…”

Section: Introductionmentioning

confidence: 99%

“…Correspondence to: T. Zelder (zelder@hft.uni-hannover.de) Zelder and Eul (2006) also used inductive probes, whereas Zelder et al (2007a) and Yhland and Stenarson (2005) applied loop couplers as contactless probes. After a conventional calibration such as Thru-Reflect-Line (TRL) given by Engen and Hoer (1979), a DUT can be characterized.…”

Section: Introductionmentioning

confidence: 99%

Usage of the contactless vector network analysis with varying transmission line geometries

et al. 2008

View full text Add to dashboard Cite

Abstract. The scattering parameters of embedded devices can be measured by means of contactless vector network analysis. To achieve accurate measurement results, the contactless measurement setup has to be calibrated. However, if the substrate material or the planar transmission lines on the substrate changes, a new calibration is necessary. In this paper a method will be examined, which reduces the number of calibration cycles by using a database. Analytical results show that by using this database method, errors occur which depend on the coupling coefficients and on the load impedances of the contactless probes. However, the measurement results show deviations smaller than 7% in comparison to the conventional vector network analysis, which is sufficient for the most pratical applications.

show abstract