Contribution of SiO/sub 2/ in neutron-induced SEU in SRAMs

Wrobel, Frédéric; Palau, J.M.; Calvet, M.-C.; Iacconi, P.

doi:10.1109/tns.2003.821596

Cited by 44 publications

(23 citation statements)

References 14 publications

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“…It was built using the MC-RED (Monte Carlo Recoil Energy Determination) code and was experimentally validated [7,8]. In this nuclear physics code, elastic reactions with silicon nuclei are studied with the ECIS [9] calculation code using the optical parameters from Koning and Delaroche [10].…”

Section: Metis Overviewmentioning

confidence: 99%

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool

Weulersse

Miller

Carrière

et al. 2015

Microelectronics Reliability

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Section: Metis Overviewmentioning

confidence: 99%

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool

Weulersse

Miller

Carrière

et al. 2015

Microelectronics Reliability

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“…In a first approximation, it is possible to only consider nuclear reactions with Silicon since it is the most abundant material in an electronic device. Nevertheless, notice that recent studies had shown that other elements in the device can have an incidence on the SEU cross section [11][12][13][14].…”

Section: Use Of Nuclear Codesmentioning

confidence: 99%

Nucleon induced recoil ions in microelectronics

Wrobel

2007

Nd2007

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Abstract. Nucleon induced nuclear reactions in microelectronic devices is a real concern for the radiation community. These nuclear reactions can provoke failures in critical applications in planes and satellites. Nuclear codes are very powerful tools which are required to calculate the number of failures of a given device in a given environment. We present the MC-RED code which is dedicated to the Monte Carlo description of nuclear reactions in microelectronic devices. We also show how its results can be use to calculate the failure rate.

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“…Actually, the energy deposition (linked to the Linear Energy Transfer) depends on the mass, the charge and the energy of the secondary ion. As in previous work [3], these reactions have been studied by distinguishing the elastic reactions from the nonelastic ones. The first ones are studied thanks to the ECIS code [4] and some optical parameters [5], [6] while the second ones are treated with the RED subroutine which allows giving the detail of each nuclear event [3].…”

Section: Nuclear Reactionsmentioning

confidence: 99%

“…As in previous work [3], these reactions have been studied by distinguishing the elastic reactions from the nonelastic ones. The first ones are studied thanks to the ECIS code [4] and some optical parameters [5], [6] while the second ones are treated with the RED subroutine which allows giving the detail of each nuclear event [3]. This subroutine uses a Monte Carlo approach to follow, step by step, the nucleus decay after the nuclear reaction.…”

Section: Nuclear Reactionsmentioning

confidence: 99%

“…It is often admitted that most of nuclear reactions which lead to an SEU occur with a silicon nucleus and calculations are then only considered with this material. Actually, previous work [3] showed that the contribution of nuclear events occurring with oxygen nuclei in SRAM-oxide such as is likely to increase the SER by about several tens of percent. Moreover, many other materials can play a role in the occurrence of SEU.…”

Section: Nuclear Reactionsmentioning

confidence: 99%

See 1 more Smart Citation

Methodology to compute neutron-Induced Alphas contribution on the SEU Cross section in sensitive RAMs

Wrobel

Palau

Iacconi

et al. 2004

IEEE Trans. Nucl. Sci.

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A methodology to quantify the single event upset (SEU) cross section in a simplified random access memory (RAM) device for neutron energy ranging from 10 MeV up to 150 MeV has been proposed and accounts for both heavy and light ions. Usual Monte Carlo method is shown to be suitable for the contribution of short range ions but not for long range ones such as alphas. An analytical approach to investigate the contribution of these long ranges particles on SEU cross section is given. It uses the efficient ions distribution which is the probability that a neutron produces an ion able to deposit a given energy over a given distance after a given range. Results show, for accurate calculations in sensitive RAMs, alphas might be considered up to 100 m from the sensitive volume.Index Terms-Efficient ion distribution, long range ions, monte carlo, neutron.

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Contribution of SiO/sub 2/ in neutron-induced SEU in SRAMs

Cited by 44 publications

References 14 publications

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool

Prediction of proton cross sections for SEU in SRAMs and SDRAMs using the METIS engineer tool

Nucleon induced recoil ions in microelectronics

Methodology to compute neutron-Induced Alphas contribution on the SEU Cross section in sensitive RAMs

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