2007
DOI: 10.1016/j.optlaseng.2006.01.010
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Conversion from phase map to coordinate: Comparison among spatial carrier, Fourier transform, and phase shifting methods

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Cited by 15 publications
(5 citation statements)
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“…Hence we need to compensate for that deviation by introducing a corrective phase pattern on the SLM. To derive the spatial coordinates of a surface from the phase patterns of interferometric measurements using that same surface is a well know problem [104]. A common, multi-image solution is to use a modification of the original Le Carré algorithm [105], the so called phase-shifting interferometry (PSI) [106].…”
Section: Correction For the Backplane Non-flatnessmentioning
confidence: 99%
“…Hence we need to compensate for that deviation by introducing a corrective phase pattern on the SLM. To derive the spatial coordinates of a surface from the phase patterns of interferometric measurements using that same surface is a well know problem [104]. A common, multi-image solution is to use a modification of the original Le Carré algorithm [105], the so called phase-shifting interferometry (PSI) [106].…”
Section: Correction For the Backplane Non-flatnessmentioning
confidence: 99%
“…[10][11] In phase shift analysis, the pattern is shifted by some fraction of the pattern period, and a series of 3 or more images is taken to generate a phase map of the pattern over the field. [17][18][19] Although it is not required, the pattern is typically assumed to be a sine wave in nature, which makes the calculation of phase more accurate with a minimum number of images. However, projecting a Ronchi ruling actually produces something closer to a square wave pattern, with small errors in the spacing between the lines.…”
Section: Physical Grating Projectorsmentioning
confidence: 99%
“…This type of pattern creates errors in phase calculaitons. [10][11][12][13][14][15][16][17][18][19][20][21] The images are analyzed using methods that allow a determination of the relative phase of any one point by means of analyzing the ratio of the intensities at that one point. The phase at each point is given by:…”
Section: Physical Grating Projectorsmentioning
confidence: 99%
“…Fringe projection profilometry (FPP) [1] is commonly used for full-field non-contact surface-shape measurement for a wide range of applications. Phase-shifting profilometry (PSP) [2] has been commonly used because of its high accuracy, high spatial resolution, and low sensitivity to variations of background intensity and surface reflectivity [2,3].…”
Section: Introductionmentioning
confidence: 99%