2020
DOI: 10.1109/jphotov.2019.2957671
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Copper-Plating Metallization With Alternative Seed Layers for c-Si Solar Cells Embedding Carrier-Selective Passivating Contacts

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Cited by 21 publications
(18 citation statements)
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“…27 Additionally, the front grid of some solar cells is Cu-plated by means of a mask-less process (plating current density of 576 mA/cm 2 for 1500 s) using evaporated titanium as seed layer. 46 For solar cells with decoupled front/rear poly-Si thicknesses, the fabrication process consists in repeating twice the SiO 2 /poly-Si deposition using a SiN x layer to protect one of the wafer's surface and a poly-Si etching in between. Poly-Si layer is etched in a mixture of HF/HNO 3 and H 2 O.…”
Section: Methodsmentioning
confidence: 99%
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“…27 Additionally, the front grid of some solar cells is Cu-plated by means of a mask-less process (plating current density of 576 mA/cm 2 for 1500 s) using evaporated titanium as seed layer. 46 For solar cells with decoupled front/rear poly-Si thicknesses, the fabrication process consists in repeating twice the SiO 2 /poly-Si deposition using a SiN x layer to protect one of the wafer's surface and a poly-Si etching in between. Poly-Si layer is etched in a mixture of HF/HNO 3 and H 2 O.…”
Section: Methodsmentioning
confidence: 99%
“…At rear side, a stack of Ag/Cr/Al (200 nm/30 nm/2 μm) is evaporated through a hard mask to define the cell area of 2.8 cm × 2.8 cm (7.84 cm 2 ), while, at the front side, a 2‐μm‐thick e‐beam evaporated Al metal grid (5% metal coverage) is structured via photolithography, etching of SiN x ARC, evaporation, and lift‐off . Additionally, the front grid of some solar cells is Cu‐plated by means of a mask‐less process (plating current density of 576 mA/cm 2 for 1500 s) using evaporated titanium as seed layer . For solar cells with decoupled front/rear poly‐Si thicknesses, the fabrication process consists in repeating twice the SiO 2 /poly‐Si deposition using a SiN x layer to protect one of the wafer's surface and a poly‐Si etching in between.…”
Section: Methodsmentioning
confidence: 99%
“…Additionally, the CE F of MF plating is much higher than the current efficiency of 30% in our previously reported MF Cu‐plating process. [ 42 ] The CE F improvement could be mainly ascribed to the fresh and optimal commercial electrolyte solution use, as well as the modification in circuit connections.…”
Section: Resultsmentioning
confidence: 99%
“…is equal to AR , and is generally 0.2–1. [ 9,18,25,42,45–47 ] For the hybrid fingers as shown in Figure 3b,c, the w top values are calculated to be 34.3 and 15.4 μm, respectively. The corresponding measured h finger values are 41 and 33 μm, and the AR eff.…”
Section: Resultsmentioning
confidence: 99%
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