Correction of systematic errors in scanning force microscopy images with application to ion track micrographs

Müller, Tanja R.; Voss, K.-O.; Lang, Michael; Neumann, R.

doi:10.1016/s0168-583x(03)01507-6

Cited by 19 publications

(29 citation statements)

References 7 publications

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“…13(a)]. This critical energy loss is in good agreement with the threshold observed for swelling 34 or when characterizing hillock appearance at the surface generated by individual ion impacts 72,83 [Figs. 1(b) and 1(c)].…”

Section: Discussion Of Experimental Resultssupporting

confidence: 79%

“…These observations are complementing previous investigations by means of surface profilometry to measure swelling, 34 atomic force microscopy 72,83 to observe surface hillocks, high resolution electron microscopy to determine track diameters, [72][73][74] and optical absorption spectroscopy to quantify the creation of color centers. 85 Compiling the large data set, we found evidence that specific phenomena appear above two different electronic energy-loss threshold values corresponding to two regimes of damage creation: (i) above S e ∼ 5 ± 2 keV/nm swelling appears, surface hillocks are formed, C-RBS reveals surface damage, and fragmentation into nanograins occurs; (ii) above ∼18 ± 3 keV/nm tracks are visualized by TEM and the areas of XRD peaks decrease significantly with increasing ion fluence.…”

Section: Discussionsupporting

confidence: 77%

“…The appearance of two thresholds in CaF 2 supports the previous interpretation for tracks in LiF, 113 where the melting and vaporization criteria were applied: swelling, 32 hillock formation, 83 and ultra-violet optical defects 114 above a critical S e value of 3.5 keV/nm are ascribed to the appearance of a molten phase (E m = 0.27 eV/at), whereas the observation of tracks above a threshold of S e ∼14 keV/nm measured by small angle x-ray scattering 113,115,116 was linked to a boiling phase (E b = 1.27 eV/at) (see Fig. 11 in Ref.…”

Section: Correlation With Other Nonamorphizable Crystalssupporting

confidence: 82%

“…For a given energy loss, the track radii for projectiles of low specific energy (∼0.1 MeV/u 73 ) are significantly larger than for ions of high specific energy (∼9 MeV/u 72,74 ), in agreement with the velocity effect discussed previously. 52 For CaF 2 , ion-induced surface hillocks measured by SFM 72,83 have radii larger than those observed by TEM [72][73][74] [Figs. 1(b) and 1(c)], in contrast to amorphizable oxides like mica.…”

Section: Track Formation In Cafmentioning

confidence: 99%

“…Comparing TEM [72][73][74] and SFM results for surface hillocks 72,83 with indirect damage characterization by means of volume swelling 34 allows the following conclusions: (i) track-related swelling increases above a critical energy loss [ Fig. 1(b)]; (ii) track radii deduced from SFM seem to be independent of S e [ Fig.…”

Section: Track Formation In Cafmentioning

confidence: 99%

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Dense and nanometric electronic excitations induced by swift heavy ions in an ionic CaF2crystal: Evidence for two thresholds of damage creation

et al. 2012

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CaF 2 crystals as representatives of the class of ionic nonamorphizable insulators were irradiated with many different swift heavy ions of energy above 0.5 MeV/u providing a broad range of electronic energy losses (S e ). Beam-induced modifications were characterized by Channeling Rutherford Backscattering Spectrometry (C-RBS) and x-ray diffraction (XRD), complemented by transmission electron microscopy (TEM). Results from C-RBS give evidence of significant damage appearing above a S e threshold of 5 ± 2 keV/nm. A second critical S e appears around 18 ± 3 keV/nm; below this value the damage as function of ion fluence saturates at 20%, while above this the damage saturation level increases with S e , reaching ∼60% for ions of S e = 30 keV/nm. XRD measurements also show effects indicating two threshold values. Above 5 keV/nm, the widths of the XRD reflection peaks increase due to the formation of nanograins, as seen by TEM, while a significant decrease of the peak areas only occurs above 18 keV/nm. The track radii deduced from C-RBS measurements are in agreement with those extracted from the fluence evolution of the widths of the XRD peaks. Moreover, track radii deduced from the peak area analysis are slightly smaller but in agreement with previous track observations by high resolution electron microscopy. Calculations based on the inelastic thermal spike model suggest that the lower threshold at 5 keV/nm is linked to the quenching of the molten phase, whereas the threshold at 18 keV/nm can be interpreted as quenching of the boiling phase. The results of CaF 2 are compared with other nonamorphizable materials such as LiF and UO 2 .

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Section: Discussion Of Experimental Resultssupporting

confidence: 79%