2014
DOI: 10.1016/j.scriptamat.2014.04.014
|View full text |Cite
|
Sign up to set email alerts
|

Creep in nanocrystalline zirconia

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

2
12
0

Year Published

2015
2015
2019
2019

Publication Types

Select...
4
1

Relationship

1
4

Authors

Journals

citations
Cited by 15 publications
(14 citation statements)
references
References 37 publications
2
12
0
Order By: Relevance
“…Using AFM to determine the role of GBS in samples deformed to high strains Most of the earlier studies examined the role of GBS by using AFM in the contact mode to evaluate the surface profile after testing [29,30,[41][42][43][44][45][46]. As also performed in this study, the vertical components of the sliding vector, hvi, were then calculated by subtracting the topographic profiles measured before and after tensile or compressive deformation.…”
Section: Discussionmentioning
confidence: 99%
See 3 more Smart Citations
“…Using AFM to determine the role of GBS in samples deformed to high strains Most of the earlier studies examined the role of GBS by using AFM in the contact mode to evaluate the surface profile after testing [29,30,[41][42][43][44][45][46]. As also performed in this study, the vertical components of the sliding vector, hvi, were then calculated by subtracting the topographic profiles measured before and after tensile or compressive deformation.…”
Section: Discussionmentioning
confidence: 99%
“…As also performed in this study, the vertical components of the sliding vector, hvi, were then calculated by subtracting the topographic profiles measured before and after tensile or compressive deformation. These earlier studies used one of two approaches to calculate hvi by measuring either (1) the topographic profile over the same set of grains [42,45] or (2) the topographic profile over similar but different sets of grains [29,30,41,43,44,46]. The first method is direct and also provides information on grain rotation and cavity nucleation and growth.…”
Section: Discussionmentioning
confidence: 99%
See 2 more Smart Citations
“…11 Schematic illustrations in isometric and side and top views showing the configurations of two neighboring grains, 1 and 2, a before and b after GBS in response to an applied axial stress: the bold lines represent marker lines drawn parallel to the applied stress which incur sharp offsets at grain boundaries equal to v i and w i on the side and top surfaces, respectively, due to the occurrence of GBS [62] at the grain boundaries. In practice, it is feasible to use AFM or SEM to measure v j with the high accuracy that is needed in order to measure the very small offsets in NC and UFG materials [62,67,69,[71][72][73].…”
Section: Effect Of a Short-term Anneal After Processingmentioning
confidence: 99%