2020
DOI: 10.3390/s20092573
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Crosstalk Analysis of a CMOS Single Membrane Thermopile Detector Array

Abstract: We present a new experimental technique to characterise the crosstalk of a thermopile-based thermal imager, based on bi-directional electrical heating of thermopile elements. The new technique provides a significantly simpler and more reliable method to determine the crosstalk, compared to a more complex experimental setup with a laser source. The technique is used to characterise a novel single-chip array, fabricated on a single dielectric membrane. We propose a theoretical model to simulate the crosstalk, wh… Show more

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Cited by 4 publications
(6 citation statements)
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“…1(a) shows the top view (optical image) of the real chip, while Fig. 1(b) shows the top view of its 3D model, where the heater pixel (circled by the red square) is electrically biased (heated) to extract its thermorelectric voltage output V h [18]. Its R can be computed by the ratio of V h to that of the applied power.…”
Section: Numerical Modelmentioning
confidence: 99%
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“…1(a) shows the top view (optical image) of the real chip, while Fig. 1(b) shows the top view of its 3D model, where the heater pixel (circled by the red square) is electrically biased (heated) to extract its thermorelectric voltage output V h [18]. Its R can be computed by the ratio of V h to that of the applied power.…”
Section: Numerical Modelmentioning
confidence: 99%
“…V T 2 between the signal generated by an optically irradiated pixel (V T 1 ), to that generated by an adjacent non-irradiated pixel (V T 2 ) [2], [18]. C is typically caused by the unwanted heat diffusion from the irradiated pixel to its neighbours [2], [19], and it can limit the FPA's spatial resolution (a measure of the smallest object that a sensor can distinguish [20]).…”
Section: Introductionmentioning
confidence: 99%
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“…Furthermore, FPAs exhibit unwanted transfer of signals, that is leakage of photons and electrons between pixels. Such pixel-topixel crosstalk can affect the spatial resolution of the detector and thus complicate the reconstruction of the desired image [38]. Another major contributor to this problem is sizeof-source effect (SSE), which arises due to imperfections within the optical system leading to reflections and scattering inside the instrument [39].…”
Section: Quantitative Thermal Imagingmentioning
confidence: 99%