Abstract:We demonstrate high-density, multi-level crystallization of a Ge 2 Sb 2 Te 5 thin film using tightly focused femtosecond laser pulses. The optical reflectivity in each distinct phase states level is characterized for applications in ultra-fast cognitive parallel data processing. The conventional computing paradigm is based on binary digital logic for data processing. With the goal of achieving low power, highly parallel cognitive computing system; the research in biologically inspired computing is an emerging filed [1,2]. In order to emulate synaptic behavior, the material/device should possess some kind of memory and also have a mechanism that can be modulated by the stimulus it receives. Ovonic optical phase-change memory (PCM) as one of kinds of suitable candidates has advantages such as high scalability, good endurance and good technological maturity [3]. In this work, we focus on the use of the optical properties in PCM for twodimensional (2D) cognitive data processing in synaptic applications.Chalcogenide glass, Ge 2 Sb 2 Te 5 (GST) is one kind of mature PCM, widely used in rewritable optical discs. It exhibits large changes of optical reflectivity, electronic conductivity and thermal conductivity between amorphous and crystalline phases, and is easily changed between these states using optical, electrical or thermal energy [4].Recent studies demonstrated the cumulative switching of GST films induced by ultrafast lasers [3,5,6]. The repeatable energy dose and rapid heat diffusion allow continuous change of its optical reflectivity, which can be used to emulate biologically inspired synaptic functions. In this work, we demonstrate high-density, multi-state crystallization of a Ge 2 Sb 2 Te 5 thin film using tightly focused femtosecond laser pulses. The partial crystallization of GST allows multi-level optical data storage for cognitive parallel data processing application.In our experiments, the 3-layer stacks were sputter deposited on 0.17 ”m glass substrates at room temperature, where the amorphous GST film of 50 nm thickness was sandwiched by a 50nm ZnS:SiO2 film on the substrate for thermal diffusion and a 50 nm layer of ZnS:SiO2 on the top to prevent degradation in the air. We locally heat the GST film using focused femtosecond laser pulses, but we control the pulse energy so that we bring heat the film to around crystallization temperature T c ; hence it only partially crystallise. The degree of crystallization is probed by measuring the optical reflectivity of the submicron switched area.In our setup, a Ti-Sapphire femtosecond laser (Coherent Chameleon Vision S) generated pulse trains of 730 nm wavelength and 85 fs duration. After that, an electronic optical modulator (EOM) pulse picker (Conoptics Corp.) was used to select single pulses eventually incident on the sample surface. Optical measurement of the change in reflectivity of GST film were conducted by using an LED array illumination on the samples surface, and at the same