1995
DOI: 10.1149/1.2048432
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Cu CVD from Copper(II) Hexafluoroacetylacetonate: I . A Cold Wall Reactor Design, Blanket Growth Rate, and Natural Selectivity

Abstract: An atmospheric pressure cold wall reactor was designed and built for the purpose of studying the thermal decomposition of Cu(hfa)2 as a repair technique for broken copper interconnection lines, using thermally biased substrates, and a laser to heat localized areas to a temperature appropriate for the deposition of pure copper. In this paper, a discussion of the design is presented, and theoretical and experimental blanket copper deposition growth rates in argon and forming gas are discussed. The primary goals … Show more

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Cited by 18 publications
(5 citation statements)
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“…4. This is 50 times faster than the rate for H 2 reduction of Cu͑hfac͒ 2 reported by Chen et al 15 using a partial pressure of Cu͑hfac͒ 2 that was 10 times lower than the present…”
Section: Resultscontrasting
confidence: 69%
See 1 more Smart Citation
“…4. This is 50 times faster than the rate for H 2 reduction of Cu͑hfac͒ 2 reported by Chen et al 15 using a partial pressure of Cu͑hfac͒ 2 that was 10 times lower than the present…”
Section: Resultscontrasting
confidence: 69%
“…7,12 A comparison with previous H 2 reduction results using very low precursor partial pressure also shows that the kinetics must become positive order in alcohol at very low alcohol pressure. 15 Single-surface intermediate model.-This complex reaction order behavior is strongly suggestive of a series reaction mechanism. In the simplest case, the precursor is assumed to react at a clean surface to produce an adsorbed intermediate.…”
Section: Discussionmentioning
confidence: 96%
“…The apparent activation energy of the overall reaction was found to be 51.9 kJ/mol. By comparison, the activation energy for metal organic chemical vapor deposition (MOCVD) using copper(II) hexafluoroacetylacetone, Cu(hfac) 2 , has been reported to be ∼75−80 kJ/mol. , In those studies, the surface reaction was assumed to be the rate-limiting step. The activation energy calculated from data reported for MOCVD using bis(2,2,6,6-tetramethyl-3,5-heptadionato)copper(II), Cu(tmhd) 2 , was ∼60 kJ/mol .…”
Section: Resultsmentioning
confidence: 99%
“…A current method widely used for copper deposition is electroplating, which requires a copper seed layer (work as a cathode) formed with physical vapor deposition. Also, various kinds of chemical vapor deposition (CVD) techniques have been studied for conformal copper deposition over the past decade in order to replace the electroplating with the CVD, which is favorably used in the semiconductor industry. Although the recent CVD techniques enable us to make a conformal copper film at a rapid growth rate and fill small features with no voids and seams, adhesions of copper films on barrier layers such as TiN, TaN, and Ta are poor in most of the techniques . High deposition temperature (>200 °C) is another drawback of this technique.…”
Section: Introductionmentioning
confidence: 99%