The kinetics and reaction mechanism for copper deposition by the hydrogen-assisted reduction of bis(2,2,7-trimethyloctane-3,5-dionato)copper(II), [Cu(tmod)2], in supercritical carbon dioxide was studied
using a differential cold wall reactor. At substrate temperatures between 220 and 270 °C, the measured
film growth rate ranged between 5 and 35 nm/min. The overall apparent activation energy was 51.9
kJ/mol. Film growth rate exhibited zero-order dependence on the precursor at precursor concentrations
between 0.02 and 0.5 wt % Cu (tmod)2 in CO2 and a zero-order dependence on hydrogen at hydrogen
concentrations greater than 0.06 wt % in CO2. Zero-order precursor dependence over large concentration
ranges promotes exceptional step coverage. At lower concentrations of either reagent a 1/2-order dependence
was observed. Film growth rate was negative order with respect to excess quantities of the hydrogenated
ligand byproduct, (tmod)H, and film growth could be suppressed completely at (tmod)H concentrations
above 1 wt %. With use of the results of the experiments, a heterogeneous reaction mechanism is proposed.
Protonation of the adsorbed ligand (tmod) was found to be the rate-determining step. A Langmuir−Hinshelwood rate expression was used to correlate the data with good agreement.