Cu₂ZnSnS₄ thin films grown by spray pyrolysis: characterization by Raman spectroscopy and X‐ray diffraction

Abstract

Cu2ZnSnS4 (CZTS) thin films were deposited on glass substrates by spray pyrolysis a fast, cost effective and vacuum‐free method. X‐ray fluorescence, Raman spectroscopy and grazing incidence X‐ray diffraction, were used to characterize the obtained thin films. The analysis of these data showed a close to stoichiometry composition of the films and CZTS adopts the kesterite type structure but with poor crystalline quality and possible existence of secondary phases, such as ZnS and Cu2SnS3. An annealing procedure in presence of elemental Sn and S was applied in order to improve the quality of the films. The annealing leads to an improvement of the crystalline quality of the thin films. The lattice parameters a and c of the annealed CZTS thin films were obtained as result of the Rietveld analysis of the gracing incidence X‐ray diffraction data. (© 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Modification of back electrode structure by a Mo intermediate layer for flexible CZTS thin film solar cells

“…6 b shows that the Raman spectra of the CZTS film with a 532 nm excitation wavelength. Three peaks at 285, 336 and 367 cm −1 match with the Raman spectroscopy of the CZTS in the other reports [28–31]. The peak at 409 cm −1 is attributed to the MoS 2 [32].…”

Effects of sulfurization time and H 2 S concentration on electrical properties of Cu 2 ZnSnS 4 films prepared by sol–gel method

“…Fig.2 shows the Raman spectra of the CZTS films with 532 nm excitation wavelength. Three peaks at 285 cm -1 , 335 cm -1 and 367 cm -1 match with the Raman spectroscopy of CZTS in the previous reports [14][15][16].…”

Growth of CZTS Thin Films by Cosputtering of Metal Targets and Sulfurization in H2S

“…Figure 1 shows the glancing incidence X-ray diffraction patterns of CZTS samples 1-3. In the GIXRD [19] pattern of all three films (usually for thin film samples, XRD is carried out in glancing incidence mode in order to remove/minimize substrate effect), peaks corresponding to kesterite CZTS structure were observed and are indexed as (110), (112), Figure 1 [20]. The diffraction pattern of sample 1 (Figure 1(a)) shows two types of crystal structures, one corresponding to CZTS and the other corresponding to CuS (at 2 = 31.7 (103), 52.6 (108), and 78.7 (213); JCPDS no.…”