2004
DOI: 10.1016/j.tsf.2003.10.089
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CuGaSe2 thin films prepared by a novel CCSVT technique for photovoltaic application

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Cited by 36 publications
(24 citation statements)
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“…All XPS data in table 2 are given relative to the Cu content (set to one) with a relative error of ~10%. The surface composition (XPS) of sample #1 and #2 strongly deviates from the bulk composition a The Na bulk concentration of 1at% [9] was related to the Cu content set to 1 b The Na bulk concentration of 0.06at% [15] was related to the Cu content set to 1 (XRF) thus showing a Cu depletion. The existence of a Cudepleted near surface region for stoichiometric and Ga-rich grown GuGaSe 2 films (see table 2, [9] and [15]) as well as stoichiometric and In-rich CuInSe 2 films [17] is well known from literature.…”
Section: Resultsmentioning
confidence: 99%
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“…All XPS data in table 2 are given relative to the Cu content (set to one) with a relative error of ~10%. The surface composition (XPS) of sample #1 and #2 strongly deviates from the bulk composition a The Na bulk concentration of 1at% [9] was related to the Cu content set to 1 b The Na bulk concentration of 0.06at% [15] was related to the Cu content set to 1 (XRF) thus showing a Cu depletion. The existence of a Cudepleted near surface region for stoichiometric and Ga-rich grown GuGaSe 2 films (see table 2, [9] and [15]) as well as stoichiometric and In-rich CuInSe 2 films [17] is well known from literature.…”
Section: Resultsmentioning
confidence: 99%
“…The bulk Na content of CCSVT thin films is far below the detection limit of XRF. It was determined by Heavy ion elastic recoil detection analysis (HI-ERDA) to an amount of 1at% [9], which corresponds to a value of 0.04 compared to Cu (see table 2). Thus, the surfaces of sample #1 and #2 are Cu-depleted and enriched in Ga, Se and Na.…”
Section: Resultsmentioning
confidence: 99%
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