2005
DOI: 10.1016/j.susc.2005.01.054
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In situ X-ray photoelectron spectroscopy study of the oxidation of CuGaSe2

Abstract: The thermal and native oxidation of CuGaSe 2 thin films was studied by in-situ X-ray photoelectron spectroscopy (XPS). The special design of the XPS chamber allowed to measure XP-spectra under oxidizing gas atmospheres at pressures of up to 5mbar (in-situ) or in ultra high vacuum (UHV). During thermal oxidation, the formation of predominantly Ga 2 O 3 and some amount of SeO 2 were observed, but no copper oxides could be detected in the near surface region of the thin films. The same oxides were found after nat… Show more

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Cited by 71 publications
(35 citation statements)
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“…From these results a surface composition of CuGa 3.1 Se 5.6 at least for the first 2-3 monolayers surveyed by this technique [12] is determined. This indicates that a copper depleted surface region of the type 1:3:5 is formed in moderately gallium rich CCSVT-grown samples, in accordance to previous results [13].…”
Section: Resultssupporting
confidence: 92%
“…From these results a surface composition of CuGa 3.1 Se 5.6 at least for the first 2-3 monolayers surveyed by this technique [12] is determined. This indicates that a copper depleted surface region of the type 1:3:5 is formed in moderately gallium rich CCSVT-grown samples, in accordance to previous results [13].…”
Section: Resultssupporting
confidence: 92%
“…Specifically, there is no structure located at a binding energy of 59 eV where Se 4+ would be located. 27 Although XPS is a surface sensitive technique, the complete absence of any higher valence feature of Se in the XPS spectra we take as evidence that valence changes in the bulk of the film are unlikely to occur. Direct measurement of the bulk electronic structure using bulk sensitive TFY-XAS measurements is discussed below, however, the Se XAS edges were outside of the photon energy range available at the U4B beam line.…”
Section: 21mentioning
confidence: 99%
“…This results in the formation of Na 2 CO 3 and also of In 2 O 3 , Ga 2 O 3 , and SeO x native oxides at the absorber surface. 9 For the deposition of the CdS layers, the CdS source and substrate temperatures were kept constant at 680 and 100°C, respectively, providing a stable deposition rate of ϳ9 nm/ min. Samples with 55 nm of PVD CdS as well as reference samples with a comparably thick CdS buffer from CBD were used for the preparation of ZnO / CdS / CIGSe solar cells.…”
mentioning
confidence: 99%
“…In the case of reference devices, the absorber GBs are passivated at first by the oxygen during the air exposure. 13,19 Furthermore, sulfur can passivate GBs, since the absorber surface is cleaned/etched in the chemical bath, 9 thereby eliminating this diffusion barrier.…”
mentioning
confidence: 99%