Heterointerfaces
coupling complex oxides exhibit coexisting functional
properties such as magnetism, superconductivity, and ferroelectricity,
often absent in their individual constituent. SrTiO
3
(STO),
a canonical band insulator, is an active constituent of such heterointerfaces.
Temperature-, strain-, or mechanical stress-induced ferroelastic transition
leads to the formation of narrow domains and domain walls in STO.
Such ferroelastic domain walls have been studied using imaging or
transport techniques and, often, the findings are influenced by the
choice and interaction of the electrodes with STO. In this work, we
use graphene as a unique platform to unveil the movement of oxygen
vacancies and ferroelastic domain walls near the STO surface by studying
the temperature and gate bias dependence of charge transport in graphene.
By sweeping the back gate voltage, we observe antihysteresis in graphene
typically observed in conventional ferroelectric oxides. Interestingly,
we find features in antihysteresis that are related to the movement
of domain walls and of oxygen vacancies in STO. We ascertain this
by analyzing the time dependence of the graphene square resistance
at different temperatures and gate bias. Density functional calculations
estimate the surface polarization and formation energies of layer-dependent
oxygen vacancies in STO. This corroborates quantitatively with the
activation energies determined from the temperature dependence of
the graphene square resistance. Introduction of a hexagonal boron
nitride (hBN) layer, of varying thicknesses, between graphene and
STO leads to a gradual disappearance of the observed features, implying
the influence of the domain walls onto the potential landscape in
graphene.