The
III–V compound semiconductor quantum dot (QD) photonic devices
have attracted considerable attention due to their stable operation
at high temperature, low threshold current, and high-speed modulation.
The photoluminescence (PL) energy of QDs depends on the dot sizes
and the energy height of barriers. It is difficult to encourage the
growth of low indium content QDs because of small lattice distortions
between the InGaAs well regions and GaAs barrier regions. In conventional
self-organized QD devices produced by Stranski–Krastanow growth
methods, the injected carriers are first captured by the wetting layers
and then dropped to the QDs with relaxation to the ground state for
QD devices. Our proposed unique quantum disk structures have no wetting
layers because the quantum well (QW) region is fully etched by using
a low-damage dry etching process. We produced 30 nm diameter and 9
nm thick InGaAs nanodisks using a biotemplate via neutral beam etching
and metal–organic vapor phase epitaxy (MOVPE). We observed
the InGaAs nanodisks via scanning electron microscopy and measured
their photoluminescence (PL). To confirm the quantum confinement effects
of InGaAs nanodisks, their energies and transient PL behaviors were
measured as a function of temperature. The combined low-damage dry
etching and MOVPE regrowth processes form an important technique,
as they promise a low-damage interface and regrowth ability. This
unique technology is attractive for carrier transportation dynamics
and spintronics of hybrid QDs and QW nanostructures, and it is easy
to adapt for industrial production systems.