Das Röntgen-Integralverfahren, eine Erweiterung des sin2ψ-Verfahrens / The X-ray-integration methode, an extension of the sin2ψ-methode / La Méthode d’intégrale aux rayons-X, une extension de la méthode dite de „sin2ψ“

Peiter, Arnold; Lode, W.

doi:10.1515/mt-1980-220705

Materials Testing

1980

DOI: 10.1515/mt-1980-220705

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Das Röntgen-Integralverfahren, eine Erweiterung des sin²ψ-Verfahrens / The X-ray-integration methode, an extension of the sin²ψ-methode / La Méthode d’intégrale aux rayons-X, une extension de la méthode dite de „sin²ψ“

Arnold Peiter¹,

W. Lode²

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2003

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Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method

Schuster

Plöger²,

Louis

2003

International Journal of Materials Research

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The paper deals with the depth determination of residual stress states from diffraction data. First an historical overview of the known approaches is given. Then we apply the approximate inverse method to this problem. This method is known to be very efficient and stable with respect to noise-contaminated data. It is even possible to prove convergence and it allows an error estimate of the calculated depth resolved residual stress profile.

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Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method

Schuster

Plöger²,

Louis

2003

International Journal of Materials Research

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Das Röntgen-Integralverfahren, eine Erweiterung des sin²ψ-Verfahrens / The X-ray-integration methode, an extension of the sin²ψ-methode / La Méthode d’intégrale aux rayons-X, une extension de la méthode dite de „sin²ψ“

Cited by 1 publication

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Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method

Depth-resolved residual stress evaluation from X-ray diffraction measurement data using the approximate inverse method

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