2008 15th IEEE International Conference on Electronics, Circuits and Systems 2008
DOI: 10.1109/icecs.2008.4674921
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DEC ECC design to improve memory reliability in Sub-100nm technologies

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Cited by 64 publications
(32 citation statements)
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“…Table 4 compares the number of ECC bits required for each PCM line, the latency, and the area of three ECC codes. A 128-bit segmented ECC requires 0.5ns [29]. However, the global rescue scheme introduces non-negligible latency and area overhead.…”
Section: Wt Section Sizementioning
confidence: 98%
“…Table 4 compares the number of ECC bits required for each PCM line, the latency, and the area of three ECC codes. A 128-bit segmented ECC requires 0.5ns [29]. However, the global rescue scheme introduces non-negligible latency and area overhead.…”
Section: Wt Section Sizementioning
confidence: 98%
“…The EG-LDPC codes are based on the structure of Euclidean geometries over a Galois field. Among EG-LDPC codes there is a subclass of codes that is one step majority logic decodable (MLD) [12].The Figure 3 shows the memory system schematic of proposed MLDD [1].…”
Section: Detector/decodermentioning
confidence: 99%
“…Due to consequence of augmenting integration densities, there is an increase in soft errors which points the need for higher error correction capabilities [1], [3]. More advanced ECCs has been proposed for memory applications but even Double Error Correction (DEC) codes with a parallel implementation results in a significant power consumption penalty.…”
Section: Introductionmentioning
confidence: 99%
“…In the case of caches or high speed memories a parallel decoder can be an interesting option to meet the delay requirements. As an example, a parallel decoder for Double Error Correction (DEC) Bose-Chaudhuri-Hocquenghem (BCH) codes was proposed in [5]. The results show that low delay can be achieved at the cost of increased circuit area.…”
Section: Introductionmentioning
confidence: 99%