1981
DOI: 10.1063/1.328820
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Deep-level transient spectroscopy system using a spectrum analyzer

Abstract: In order to measure the thermal emission rate of a trap in semiconductor material without scanning the temperature, a new method, which utilizes a spectrum analyzer, has been developed. The theory on which our measuements depend is based on the relation between the time constant of a pure exponential wave and the relative amplitudes of its Fourier Components. The time constant is given by ts = (t/2r)[(10c−1)/(m2−10cn2)]1/2, where c = (Xn−xm/10, t is the period of the exponential wave, and xn and xm are the amp… Show more

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Cited by 10 publications
(2 citation statements)
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“…Wang et a/ [9] ont proposi une variante oti un analyseur de spectre remplace la detection synchrone. Ces auteurs peuvent alors mesurer les ampljtudes de la fondamentale et des premieres harmoniques def(t, T).…”
Section: Introductionunclassified
“…Wang et a/ [9] ont proposi une variante oti un analyseur de spectre remplace la detection synchrone. Ces auteurs peuvent alors mesurer les ampljtudes de la fondamentale et des premieres harmoniques def(t, T).…”
Section: Introductionunclassified
“…87 , and Wang et.al. 88 ) The method is based on the result that for a continuous exponentially decaying function, β /ω is given by:…”
Section: Appendix A: Fft Algorithm For Decay Constant Calculationmentioning
confidence: 99%