Defect-based rf testing using a new catastrophic fault model

(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

“…However, the load board circuitry is too complex for its direct BIST implementation, and hence this approach is limited to the test of discrete RF circuits. The approaches in [29][30][31] focus on failure diagnosis of RF circuits. The work in [29] considers the detection of catastrophic faults, while those in [30,31] also attempt to isolate parametric ones.…”

“…The approaches in [29][30][31] focus on failure diagnosis of RF circuits. The work in [29] considers the detection of catastrophic faults, while those in [30,31] also attempt to isolate parametric ones. Although behavioral simulations demonstrate high fault coverage, they lack a general fault model, and it is necessary the use of standard RF test equipment and techniques to enable failure diagnosis.…”

Built-in Loopback Test for IC RF Transceivers

“…For this reason, more time effective fault-oriented structural tests and specs-oriented alternative tests have been proposed. Those tests are based on fault modeling [11]- [15], [23], and require optimization to attain maximum test efficiency. To make the RF LBT model tractable in terms of the simulation time, fault abstraction which covers various on-chip defects and unintended local-or global process variations, characteristic of the employed technology is needed.…”

Low-cost signature test of RF blocks based on envelope response analysis

“…Reducing RF test complexity and cost is still an open research topic that has been addressed in a number of different approaches [1]. Recent work in this area includes defect modeling and failure diagnosis [2]- [5], alternate test [5]- [6], DfT and BIST techniques [7]- [13], etc.…”