2016
DOI: 10.1016/j.scriptamat.2016.03.004
|View full text |Cite
|
Sign up to set email alerts
|

Deformation of lamellar TiAl alloys by longitudinal twinning

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

3
30
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
7

Relationship

3
4

Authors

Journals

citations
Cited by 51 publications
(33 citation statements)
references
References 26 publications
3
30
0
Order By: Relevance
“…This causes the III T domain to be more confined in the physical pillar. This restriction probably inhibited the activation of the longitudinal twinning of III T [16,35], explaining why it was not seen in the experiment, as concluded previously [16,35,67]. Secondly, although EBSD shows that there was an occurrence of longitudinal twinning in lamella I M (Fig.…”
Section: Deformation Twinning and Its Influence On Mechanical Propertiessupporting
confidence: 57%
See 2 more Smart Citations
“…This causes the III T domain to be more confined in the physical pillar. This restriction probably inhibited the activation of the longitudinal twinning of III T [16,35], explaining why it was not seen in the experiment, as concluded previously [16,35,67]. Secondly, although EBSD shows that there was an occurrence of longitudinal twinning in lamella I M (Fig.…”
Section: Deformation Twinning and Its Influence On Mechanical Propertiessupporting
confidence: 57%
“…Because internal stress inherently relates to microstructures of constituent phases, it is important to study the relationships between microstructure and deformation in TiAl alloys. There have been a number of studies to understand such relationships via ex-situ and in-situ mechanical testing and electron microscopy (EM) [6,15,16]. However, complex microstructures make it difficult to interpret experimentally observed behaviour.…”
mentioning
confidence: 99%
See 1 more Smart Citation
“…Elsewhere, preliminary results by the present authors have shown from DIC strain mapping of deformed micropillars of TiAl lamellar stacks milled from individual colonies that by 10 % strain, bands of high shear strain develop near or at the lamellar interfaces [10]. Further, high temperature testing of micropillars is possible up to 630 °C ex situ [11], and using in situ equipment [12], up to 800 °C [13].…”
Section: Introductionmentioning
confidence: 59%
“…For high resolution DIC at room temperature, this can be achieved by the deposition of SiO 2 or Al 2 O 3 colloids [2,12,13], or metal nanoparticles (Pt, Au) [14,15], electron beam Pt deposition (suitable for small areas only) [16][17][18][19] and reconstructed metal thin films [1,20]. The latter, also referred to as thin film remodelling [1], is where a thin film is heat treated so that it breaks up into an array of particles.…”
Section: Introductionmentioning
confidence: 99%