2000
DOI: 10.1016/s0167-9260(00)00005-5
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Delay and noise estimation of CMOS logic gates driving coupled resistive–capacitive interconnections

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Cited by 32 publications
(10 citation statements)
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“…Here, in the static CMOS logic,increasing levels of device integration, die size, and operating frequency, a burgeoning portable and embedded computing and communications market, combined with reliability and packaging cost concerns, have made power dissipation a major issue in VLSI design. In complementary static CMOS, a popular VLSI logic style,power is primarily dissipated during logic transitions when gate loadcapacitances charge and discharge [10]. Also the number of transistors required in static logic family is two times the number of inputs which increases the occupied area-an undesirable characteristic where Though the static CMOS logic offers less speed, it is best known for its lowest power dissipation [7].…”
Section: Mechanismmentioning
confidence: 99%
“…Here, in the static CMOS logic,increasing levels of device integration, die size, and operating frequency, a burgeoning portable and embedded computing and communications market, combined with reliability and packaging cost concerns, have made power dissipation a major issue in VLSI design. In complementary static CMOS, a popular VLSI logic style,power is primarily dissipated during logic transitions when gate loadcapacitances charge and discharge [10]. Also the number of transistors required in static logic family is two times the number of inputs which increases the occupied area-an undesirable characteristic where Though the static CMOS logic offers less speed, it is best known for its lowest power dissipation [7].…”
Section: Mechanismmentioning
confidence: 99%
“…7, based on closed-form expressions for the line resistance, capacitance, and inductance [11], [12]. The criticality of the capacitive coupling is determined by the ratio of the coupling and self-capacitance, where an increase in the ratio results in increased capacitive coupling noise [15]. The maximum ratio occurs for narrow and close lines (see Fig.…”
Section: Dependence Of Coupling Noise On Layout Parametersmentioning
confidence: 99%
“…Several models have been presented in the literature for calculating crosstalk noise effects analytically, instead of using nonlinear circuit simulation [4], [6], [22], [28]- [31]. These models use linearizations to approximate the behavior of a logic gate by a Thevenin voltage source in series with an effective linear output resistance, and a lumped RC network to approximate the distributed coupled wires.…”
Section: Noise Effects and Their Dependencementioning
confidence: 99%
“…The coupled noise voltage waveform might induce a logic hazard on a "quiet" victim net, leading to eventual logic failure. If noise is injected into a victim net during logic transition it can modify the victim's waveform, causing delay uncertainty [4]- [6] depending on the detailed behavior of aggressor signals. Consequently, a noncritical path might become a critical speed path, and clocking frequency may be limited by noise.…”
Section: Introductionmentioning
confidence: 99%