2022 International Electron Devices Meeting (IEDM) 2022
DOI: 10.1109/iedm45625.2022.10019450
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Demonstration of a Multi-Level μA-Range Bulk Switching ReRAM and its Application for Keyword Spotting

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Cited by 6 publications
(8 citation statements)
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“…Switching of f‐RRAM is typically abrupt and stochastic, since the conductance change is dominated by the movement of only a few ions in the conductive filaments. [ 6a,7b,14b ] In a recent work, [ 18 ] we introduced a non‐filamentary bulk RRAM (b‐RRAM) device, and showed that b‐RRAMs can be reliably programmed up to 128 levels between 400 nA and 4 µA (4–40 µS) across 300 mm wafer [ 18 ] (Figure S1, Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
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“…Switching of f‐RRAM is typically abrupt and stochastic, since the conductance change is dominated by the movement of only a few ions in the conductive filaments. [ 6a,7b,14b ] In a recent work, [ 18 ] we introduced a non‐filamentary bulk RRAM (b‐RRAM) device, and showed that b‐RRAMs can be reliably programmed up to 128 levels between 400 nA and 4 µA (4–40 µS) across 300 mm wafer [ 18 ] (Figure S1, Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…This particular phase has inherently high V O concentration, which is critical for forming‐free and bulk type switching. [ 18 ] More details on the device fabrication and material characterization can be found in. [ 16 ]…”
Section: Resultsmentioning
confidence: 99%
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“…The pretrained weights are mapped as device conductance values scaled by device conductance range. Since RRAM devices support multibit mapping, [ 20 ] our experiments are based on devices with 16 conductance levels, i.e., 4‐bit precision, as shown in Figure 2c. Multibit inputs are supported using the bit‐serial input scheme.…”
Section: Cim System For Dnn Inference Accelerationmentioning
confidence: 99%