2003
DOI: 10.1117/12.485244
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Dense only phase-shift template lithography

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Cited by 11 publications
(7 citation statements)
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“…To include other features on the layer such as the horizontally-oriented poly-silicon connection paths and contact-landing pads, whose dimensions are not critical for cell area and can be designed larger, many * A transistor pitch, also called a "contacted pitch", is the minimum pitch between two gates with a contact between them. other template-trim approaches can be used 12,14,15,18 and the final number of exposures, masks, and resistor layers might be different. For example, since most of the gate are vertically-orientated in standard cells, it is a suitable application of Canon IDEAL method.…”
Section: Lithographic Methods For Gridded Layout Standard Cellsmentioning
confidence: 99%
See 3 more Smart Citations
“…To include other features on the layer such as the horizontally-oriented poly-silicon connection paths and contact-landing pads, whose dimensions are not critical for cell area and can be designed larger, many * A transistor pitch, also called a "contacted pitch", is the minimum pitch between two gates with a contact between them. other template-trim approaches can be used 12,14,15,18 and the final number of exposures, masks, and resistor layers might be different. For example, since most of the gate are vertically-orientated in standard cells, it is a suitable application of Canon IDEAL method.…”
Section: Lithographic Methods For Gridded Layout Standard Cellsmentioning
confidence: 99%
“…Because there are many template-trim approaches available 12,14,15,18 for the poly-silicon layer, the final number of exposures, masks, and resistor layers might be different, leading to different impact on design rules and manufacturing cost.…”
Section: Layout Area Vs Manufacturing Costmentioning
confidence: 99%
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“…It is pointed out [8] that full chip layouts may need to be assembled as a collection of regular printable patterns for technologies beyond 90nm, and layouts in the 65nm technology node have a high likelihood to look like regular gratings: uniform pitch and width on metal as well as polysiliconconductor (PC) layers. In [6], lithographic techniques have been demonstrated to reliably print minimum polysilicon lines which are placed on grid. In [17,15,16] Liebmann et al proposed a simplified layout optimization methodology which is based on restrictive design rules (RDRs) to better enable alternating phase shifted mask designs and control line-width on the PC layer in ultra-deep submicron technologies.…”
Section: Introductionmentioning
confidence: 99%