Local reduction of the copper oxide film was performed by an atmospheric-pressure inductively coupled plasma (AP-ICP) microjet and the fundamental characteristics of the removal process were studied. CuO and Cu 2 O films were formed on the sputtered Cu surface by thermal annealing. The sample was then exposed to the Ar-H 2 AP-ICP microjet. The chemical composition, morphology, and the film thickness before and after the plasma treatment were analyzed by XPS, optical microscopy, and SEM/EDX. CuO and Cu 2 O were reduced to form porous Cu at the speed of 380 nm/min. Heterogeneous reduction patterns inside the Cu 2 O layer were observed due to the fast diffusion of H atoms through the narrow gap between the columnar structures.