“…silicon, water), but is locally enhanced in regions pervaded by an electric field E 0 , which, as a polar vector, lifts inversion symmetry. This electric field-induced second-harmonic (EFISH) process, first demonstrated in the 1960s [1], has been widely employed as a probe of electric fields in semiconductor devices [2,3,4,5,6,7] and in aqueous environments [8,9,10]. However, despite extensive development of second-harmonic microscopy in other contexts [11,12,13], the potential of EFISH for diffraction-limited microscopy of electric fields remains largely untapped [14].…”