2010
DOI: 10.1016/j.tsf.2009.11.051
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Deposition of amorphous carbon nitride films using Ar/N2 supermagnetron sputter

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Cited by 5 publications
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“…The intensities of the absorption bands at 2930 cm -1 (CH 3 , CH 2 , and CH bonds) decreased and those at 1100 to 1700 cm -1 (C = C, C = N, and C = N-H bonds) increased with an increase in LORF [15]. The intensities of the absorption bands at 3300 cm -1 (NH bonds) changed little with LORF, but the absorption band at 3200 -3700 cm -1 (OH bond) was observed at LORF of 50 W [16]. H 2 O molecules adsorbed on the plasma chamber wall were estimated to be taken into the films by the H 2 O sputtering at 200/50 W.…”
Section: Physical and Chemical Characteristics Of The Filmsmentioning
confidence: 94%
“…The intensities of the absorption bands at 2930 cm -1 (CH 3 , CH 2 , and CH bonds) decreased and those at 1100 to 1700 cm -1 (C = C, C = N, and C = N-H bonds) increased with an increase in LORF [15]. The intensities of the absorption bands at 3300 cm -1 (NH bonds) changed little with LORF, but the absorption band at 3200 -3700 cm -1 (OH bond) was observed at LORF of 50 W [16]. H 2 O molecules adsorbed on the plasma chamber wall were estimated to be taken into the films by the H 2 O sputtering at 200/50 W.…”
Section: Physical and Chemical Characteristics Of The Filmsmentioning
confidence: 94%