1989
DOI: 10.1364/ao.28.002806
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Deposition of optical thin films by pulsed laser assisted evaporation

Abstract: Thin films of several refractory metal oxides and Ge were deposited by pulsed laser evaporation using a TEA CO(2) laser. Films deposited on ambient temperature substrates had a polycrystalline microstructure. Ge films deposited on 300 degrees C substrates were single crystalline. The refractive indices of these films were higher than indices of films deposited by conventional evaporation techniques and were bulk values for HfO(2) and ZrO(2). The crystalline microstructure and high packing density of the films … Show more

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Cited by 72 publications
(18 citation statements)
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“…In addition to its potential use as a gate dielectric, HfO 2 is also used as an optical coating because of its high refractive index and high transmission coefficient. 5,6 Additionally, HfO 2 exhibits a relatively high laser damage threshold due to its high melting point, thermal and chemical stability and wide transparent range from the infrared to ultraviolet. 7,8 Furthermore, HfO 2 serves as an excellent protective coating due to its thermal stability and hardness.…”
Section: Introductionmentioning
confidence: 99%
“…In addition to its potential use as a gate dielectric, HfO 2 is also used as an optical coating because of its high refractive index and high transmission coefficient. 5,6 Additionally, HfO 2 exhibits a relatively high laser damage threshold due to its high melting point, thermal and chemical stability and wide transparent range from the infrared to ultraviolet. 7,8 Furthermore, HfO 2 serves as an excellent protective coating due to its thermal stability and hardness.…”
Section: Introductionmentioning
confidence: 99%
“…1,[3][4][5] In addition to its potential use in the microelectronics industry, HfO 2 is also employed in optical coatings because of its high refractive index and high transmission coefficient. 6 Accurate thickness control and thickness uniformity of the deposited HfO 2 film are also required for these applications.…”
mentioning
confidence: 99%
“…Several approaches and techniques have been developed to address these challenges relating to film quality in both MS and PLD 1214 . Unbalanced magnetron sputtering 15 , the high power impulse MS (HIPIMS) process 16 , and plasma assisted PLD 17 are recent developments that can improve certain characteristics of the deposited films.…”
Section: Introductionmentioning
confidence: 99%