1995
DOI: 10.1088/0031-9155/40/8/007
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Depth of ionization chamber in water

Abstract: The device developed by the authors and described here enables the user to measure the depth from the water surface to the point of measurement for a cylindrical ion chamber with a waterproof plastic cap in a water phantom, free of surface-tension error with a high precision. The device seeks vertical orientation and provides the convenience of hands-free operation. The measurement process is simple and quick with a precision of 0.1 mm. (The device is currently available as a 'water phantom depth gauge' from N… Show more

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Cited by 5 publications
(7 citation statements)
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“…Given the 0.07 mm accuracy of the telescopic standard (see Data ) the conclusion is that the gCAP method accurately reproduces the point at which the IC touches the water surface with an uncertainty of approximately 0.1 mm. This is significantly less than the 0.33 mm to 0.5 mm estimated by the AAPM TG‐51 addendum and is similar to that reported for specialized mechanical devices …”
Section: Scans and Resultssupporting
confidence: 70%
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“…Given the 0.07 mm accuracy of the telescopic standard (see Data ) the conclusion is that the gCAP method accurately reproduces the point at which the IC touches the water surface with an uncertainty of approximately 0.1 mm. This is significantly less than the 0.33 mm to 0.5 mm estimated by the AAPM TG‐51 addendum and is similar to that reported for specialized mechanical devices …”
Section: Scans and Resultssupporting
confidence: 70%
“…This paper experimentally demonstrates a method to quantitatively set or confirm IC positioning with respect to a water surface to within an uncertainty of approximately 0.1 mm. This is significantly less than the 0.33–0.5 mm uncertainty estimated for the TG‐106 reflection method and is similar to the 0.1 mm reported for specialized mechanical devices . Since the gCAP method relies only on knowledge of the IC OR and the measured depth‐dose data to define the position, unlike other methods, it can be retrospectively applied to a given scan to confirm IC positioning.…”
Section: Discussionsupporting
confidence: 58%
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