2009
DOI: 10.1107/s0108767309007508
|View full text |Cite
|
Sign up to set email alerts
|

Depth profiling of polymer films with grazing-incidence small-angle X-ray scattering

Abstract: A model-free method of reconstructing depth-specific lateral scattering from incident-angle-resolved grazing-incidence small-angle X-ray scattering (GISAXS) data is proposed. The information on the material which is available through variation of the X-ray penetration depth with incident angle is accessed through reference to the reflected branch of the GISAXS process. Reconstruction of the scattering from lateral density fluctuations is achieved by solving the resulting Fredholm integral equation with minimal… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
11
0

Year Published

2011
2011
2024
2024

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 18 publications
(11 citation statements)
references
References 42 publications
(52 reference statements)
0
11
0
Order By: Relevance
“…5 , which shows Miller indices for a FAPbI 3 thin film). In addition, this analysis technique can provide investigation of the local crystal phase distribution as a function of film depth by varying the Grazing Incident X-ray (GIX) angle (°) 24 . In Fig.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…5 , which shows Miller indices for a FAPbI 3 thin film). In addition, this analysis technique can provide investigation of the local crystal phase distribution as a function of film depth by varying the Grazing Incident X-ray (GIX) angle (°) 24 . In Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Two-dimensional GIWAXS 2 dimension (2D) patterns were recorded with a 2D CCD detector (Rayonix MX 225-HS, USA). Diffraction angles were calibrated by a pre-calibrated sucrose (Monoclinic, P2 1 , a = 10.8631 Å, b = 8.7044 Å, c = 7.7624 Å, b = 102.938°) 24 and the sample-to-detector distance was 246.4 mm. The samples were exposed to X-ray beam energy of 11.6 keV for only 10 s to prevent damage.…”
Section: Methodsmentioning
confidence: 99%
“…One can thus compare the structure at the surface vs. within a film, resolving the ambiguities inherent to AFM and SEM. With some care, one can more gradually vary the incident angle, to reconstruct the structure as a function of film depth (rather than simply the average order through the film) [47,350,[353][354][355][356][357]. GISAXS has thus emerged as a powerful means for studying nanostructured soft materials, including studying them in-situ during assembly or conversion; block-copolymers have been extensively studied in this way [358][359][360][361][362][363][364][365].…”
Section: 2mentioning
confidence: 99%
“…The most intense reflections of cellulose II occur at q = 1.5 Å À1 , there is no evidence of cellulose II diffraction peaks [27]. Within the range of depths probed by the evanescent X-ray beam [28], the cellulose film is completely and homogenously amorphous. GIWAXS measurement of the cellulose nanocrystal film revealed high crystallinity (Fig.…”
Section: Cellulose Film Preparation and Propertiesmentioning
confidence: 97%