2008 10th Electronics Packaging Technology Conference 2008
DOI: 10.1109/eptc.2008.4763588
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Design for Cyclic Bending Reliability of Large PBGA Assembly Using Experimental and Numerical Methods

Abstract: the bending fatigue life of electronic assembly. The solderIn this paper, four-point cyclic bend test was conducted for fatigue failure is the dominant failure mode when solder PBGA (Plastic Ball Grid Array) assembly with Sn-3.5Ag lead jointed electronic assembly subjected to cyclic bending load. free solder joint. Bending fatigue life of solder joint was Based on failure analysis, new solder ball layout design was recorded by measuring resistance of the designed daisy-chain presented to improve bending reliab… Show more

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Cited by 3 publications
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