Design-for-reliability (DfR) of aerospace electronics: Attributes and challenges

A unified multiple stress reliability model for microelectronic devices — Application to 1.55 μm DFB laser diode module for space validation

“…These expressions may not look much like a multiple-stress model but in fact it is as we have shown in paper presented at the 2013 IEEE Aerospace Conference [4]:…”

“…In 2013 Ref. [3,4] have presented two advanced Probabilistic Design-for-Reliability (PDfR) concepts to address the prediction of the reliability of aerospace electronics: 1) Boltzmann-Arrhenius-Zhurkov (BAZ) model for the evaluation of the probability of failure (ProF) after the given time in operation at the given temperature and under the given stress (not necessarily mechanical), and 2) extreme value distribution (EVD) technique that can be used to predict the number of repetitive loadings that closes the gap between the capacity (stress-free activation energy) of a material (device) and the demand (loading), thereby leading to a failure.…”

Microelectronic reliability models for more than moore nanotechnology products

“…Since 2010, a generalized multiple stress reliability model and Suhir, E. was published on a comprehensive model called Boltzmann-Arrhenius-Zhurkov (BAZ) model [7], [8], [29], [30]. The premises of this model was addressed by D. Cox [9] in Journal of the Royal Statistical Society 1972.…”

“…As presented in ref [29], all failure mechanisms models as detailed in JEDEC JEP122 can be rearranged in the following form (17) Where the function g(S) are a function of stressor parameter always expressed in two ways generalized expressions:…”

M-STORM reliability model applied to DSM technologies

“…Bathtub curve is an idealized view of instantaneous failure rate scenario generally considered in well-known MIL, JEDEC or TELCORDIA [3] Standards. In 2013, a generalized view of the existing reliability models was presented by E. Suhir et al [4], [5], describing probabilistic design-for-reliability (PDfR) concepts addressing a version to predict the reliability of aerospace electronics. The Boltzmann-Arrhenius-Zhurkov (BAZ) model very similar to *Research conducted under Electronic Robustness contract Robustness Project IRT-008 managed by IRT Saint Exupery, Toulouse (France) and sponsored by: Agence Nationale de la Recherche, Airbus Operations SAS, Airbus Group Innovation, Continental Automotive France, Thales Alenia COX model [6], was refined for the evaluation of the Probability of Failure (ProF) under operational application at given temperature and under the various stresses (not necessarily mechanical).…”