Design of an X-ray diagnosis system with TIADC

Abstract

X-ray diagnosis is a crucial aspect of nuclear experiments, as many fields in physical research require X-ray analysis. The X-ray diode (XRD) detector is commonly used in X-ray detection due to its short response time, necessitating a high-speed readout circuit. In this paper, we present the design of an X-ray diagnosis system with readout electronics utilizing time-interleaved analog-to-digital converters (TIADC). One of the challenging problems in TIADC is the mismatch problem between channels, which severely reduces the system's performance. We propose a fast calibration method for adjusting the mismatch, significantly improving the acquisition system's performance. We have implemented an adapted module to perform the calibration in real-time. In performance tests, the proposed method is shown to be as effective as other methods, and the electronic performance of the system meets the diagnosis requirements. The X-ray signals acquired by this system exhibit high quality in the inertial confinement fusion (ICF) of the SG-III laser facility.

An efficient calibration method for digital bandwidth interleaving sampling system

“…Parallel sampling technology has witnessed rapid development over the past few decades, as indicated by various studies [1][2][3].This technique leverages interleaved sampling in either the time or frequency domain to increase the sampling rate and bandwidth. Consequently, it caters to the requirements of fields such as communication, nuclear physics experiments, and electronic measurements, which demand high-speed sampling systems [4][5][6][7][8][9].…”

“…The time-interleaved analog-to-digital converter (TIADC), representing a parallel sampling structure, has gradually emerged as a prominent ADC topology [10]. In recent years, a large number of studies have been dedicated to studying the calibration method of mismatch error of TIADC [3,5,[11][12][13], and more studies tend to adopt more efficient background calibration methods to be integrated into ADC chips or FPGAs [11,12]. However, most calibration methods are only suitable for narrowband calibration, assuming that the time mismatch error and gain mismatch error are constant within the wideband.…”