2015 6th International Conference on Computers and Devices for Communication (CODEC) 2015
DOI: 10.1109/codec.2015.7893195
|View full text |Cite
|
Sign up to set email alerts
|

Design of band-gap engineered silicon-germanium Junctionless Double-gate FET for ZRAM application

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 10 publications
0
1
0
Order By: Relevance
“…In the past ten years, various device structures attempting to overcome the RT degradation due to silicon film thickness downscaling such as ZRAM, A 2 RAM, and feedback field-effect transistor (FBFET) were proposed for the 1 T DRAM. [11][12][13][14][15] Among various transistor structures, tunneling and FBFETs have attracted attention due to their low gate voltage operation and outstanding switching characteristics. [16][17][18][19][20][21] The switching characteristics of FBFET can contribute to high current ratio characteristics when the device is applied to 1 T DRAM.…”
Section: Introductionmentioning
confidence: 99%
“…In the past ten years, various device structures attempting to overcome the RT degradation due to silicon film thickness downscaling such as ZRAM, A 2 RAM, and feedback field-effect transistor (FBFET) were proposed for the 1 T DRAM. [11][12][13][14][15] Among various transistor structures, tunneling and FBFETs have attracted attention due to their low gate voltage operation and outstanding switching characteristics. [16][17][18][19][20][21] The switching characteristics of FBFET can contribute to high current ratio characteristics when the device is applied to 1 T DRAM.…”
Section: Introductionmentioning
confidence: 99%