Design of PIC microcontroller-based data acquisition module with lab VIEW interfacing

Kale, Aniket Vilas; Bankar, Sanket A.; Jagtap, Satyawan R.

doi:10.1109/iccsp.2014.6949965

Cited by 5 publications

(3 citation statements)

References 1 publication

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“…The software-defined radio test site is published by authors in [ 23 ]. Microcontroller-based control boards are also used in acquiring low-voltage signals as discussed in [ 24 ]. A complex RF test site is presented in [ 25 ] where the device under test is a configurable device and the tests are focused on finding tuning faults.…”

Section: Related Workmentioning

confidence: 99%

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Siddiqui

Otero

Zubair

2023

Sensors

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Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry out two things, i.e., proof of design and manufacturing tests. The team responsible for designing test sites considers several parameters like deployment cost, test time, test coverage, etc. In this study, an automated test site using a supervised machine learning algorithm for testing an ultra-high frequency (UHF) transceiver is presented. The test site is designed in three steps. Firstly, an initial manual test site is designed. Secondly, the manual design is upgraded into a fully automated test site. And finally supervised machine learning is applied to the automated design to further enhance the capability. The manual test site setup is required to streamline the test sequence and validate the control and measurements taken from the test equipment and unit under test (UUT) performance. The manual test results showed a high test time, and some inconsistencies were observed when the test operator was required to change component values to tune the UUT. There was also a sudden increase in the UUT quantities and so, to cater for this, the test site is upgraded to an automated test site while the issue of inconsistencies is resolved through the application of machine learning. The automated test site significantly reduced test time per UUT. To support the test operator in selecting the correct component value the first time, a supervised machine learning algorithm is applied. The results show an overall improvement in terms of reduced test time, increased consistency, and improved quality through automation and machine learning.

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Section: Related Workmentioning

confidence: 99%

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Siddiqui

Otero

Zubair

2023

Sensors

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“…DAQ system [22], [29], [32] LabVIEW NI DAQ devices, GPIB interface, Oscilloscope, PIC microcontroller, transducer Motor control circuits DC motor driver [21] LabVIEW NI myRIO, DC motor driver Induction motor [17] LabVIEW Data acquisition (DAQ) and control Motor control [36] LabVIEW Camera, Arduino Internet of things-based products Internet of things [9], [23] LabVIEW / COTS Network switch, Oscilloscope. waveform generator Various circuits and products Printed circuit board (PCB) [5] LabVIEW PXI system, Bed of Nails (BoN) fixture Backplane [1] COTS COTS cable tester, connectors Cable assembly [33] LabVIEW NI DAQ The electronic control unit [42] LabVIEW CAN bus, Power supply GPIB based system [35] HP VEE Pro GPIB interface Microfluidic device [13] LabVIEW Camera and accessories Optical device [16] LabVIEW Data acquisition (DAQ) Power supply control [44] LabVIEW Power supply, digital multimeter, GPIB Underwater modem [11] LabVIEW Sensors, cables Thermal cycle for the unit under test [37] LabVIEW Environmental test chamber interface Temperature probe [8] COTS Analyzer, antenna Refrigerator [45] LabVIEW ATE, test jig, RS232, ADC, and sensors RF circuits and products Antenna [30] LabVIEW Arduino, Stepper motors, and drivers Antenna [6], [7] COTS Analyzer, cables RF circuit [26] LabVIEW NI PXI, Signal generator, RF current probe [38] LabVIEW Spectrum analyzer, Signal generator RF device [41] LabVIEW SPI, I2C, HPIB Software-defined radio [46] LabVIEW Signal generator, Spectrum analyzer, RS232, GPIB Wireless sensor network [18] LabVIEW Digital multimeter, Power supply, and GPIB A low-frequency signal processing system is developed by authors in [24] using LabVIEW and NI Elvis.…”

Section: B Review Of Existing Electronic Product Test Sitesmentioning

confidence: 99%

“…The authors proposed architecture for automatic hardware that includes most of the common interfaces including GPIB in [31]. In [32] the authors used a PIC microcontroller to acquire data from a transducer. The test software is developed in LabVIEW.…”

Section: B Review Of Existing Electronic Product Test Sitesmentioning

confidence: 99%

A Novel Process to Setup Electronic Products Test Sites Based on Figure of Merit and Machine Learning

2021

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Consumer electronic manufacturing (CEM) companies maintain a range of electronic products that are designed and tested according to the type and end-user requirements. These electronic products go through a validation and verification test for proof of design and a manufacturing test for checking reliability, quality, and manufacturing defects. Testing is carried out using test sites, designed based on the electronic product type. Currently, there is no standard approach for setting up a test site for electronic products. In this research, two processes are presented, for setting up new test sites and optimization of existing test sites for consumer and other electronic products. The proposed processes include a voice of customer (VoC) interface, that is based on a unique dataset and through machine-learning technique automatically translate customer information into customer requirements, and a figure of merit (FoM) presented as an outcome of this research using several key test-related parameters. These proposed processes are an important step towards defining a standard approach for setting test sites for consumer and other electronic products. The processes are implemented using a software application developed in LabVIEW, which is linked to a database containing test data for around 400 products collected as part of this research and form a knowledge base for the proposed processes. Finally, the processes are validated by setting up a new experimental test site for an RF receiver and optimization of an existing test site of an antenna system.INDEX TERMS Consumer electronic manufacturing (CEM), electronic product test, figure-of-merit (FoM), LabVIEW, machine-learning, voice of customer (VoC).

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A Survey on the CEM Life Cycle and their Test Sites Limitations & Constraints

Fayyaz¹,

Zubair²,

Baro³

2023

2023 Global Conference on Wireless and Optical Technologies (GCWOT)

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Design of PIC microcontroller-based data acquisition module with lab VIEW interfacing

Cited by 5 publications

References 1 publication

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

A Novel Process to Setup Electronic Products Test Sites Based on Figure of Merit and Machine Learning

A Survey on the CEM Life Cycle and their Test Sites Limitations & Constraints

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