2009
DOI: 10.1109/tcsii.2009.2020945
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Design Solutions for Sample-and-Hold Circuits in CMOS Nanometer Technologies

Abstract: Solutions for the design of low-voltage sample-andhold (S/H) circuits in CMOS nanometer technologies are presented. As a design example, a 0.8-V supply S/H is designed and simulated using a 130-nm CMOS process. It dissipates 0.5 mW at dc and provides almost a rail-to-rail signal swing. When clocked at 40 MS/s and with a 1.4-VPP differential input signal, the simulated spurious-free dynamic range, signal-to-noise ratio, and total harmonic distortion are 57, 67, and −56 dB (9 equivalent bits), respectively, with… Show more

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Cited by 31 publications
(25 citation statements)
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“…It should be noted that switch size is constant for all Vdd voltages. Some additional simulations are done to compare between the proposed switch with bootstrapped NMOS switch (with dummy switch), [6], [13] and [26]. The simulation conditions for all schemes are the same.…”
Section: Simulation Resultsmentioning
confidence: 99%
“…It should be noted that switch size is constant for all Vdd voltages. Some additional simulations are done to compare between the proposed switch with bootstrapped NMOS switch (with dummy switch), [6], [13] and [26]. The simulation conditions for all schemes are the same.…”
Section: Simulation Resultsmentioning
confidence: 99%
“…2,3 As it can be seen in Figure 1, in this method, a dummy transistor is used to absorb the deposited channel charge of the main transistor. Using a dummy transistor is one of the earliest solutions to reduce the switch-induced errors.…”
Section: Discussionmentioning
confidence: 99%
“…The Equation 3 shows that for a simple MOS switch, the error ΔV is independent on input signal level; therefore, unlike to the charge injection error, the effect of the clock feedthrough on the holding capacitor is linear. The Equation 3 shows that for a simple MOS switch, the error ΔV is independent on input signal level; therefore, unlike to the charge injection error, the effect of the clock feedthrough on the holding capacitor is linear.…”
Section: Figurementioning
confidence: 99%
“…The evolution of integrated circuit technologies, partially helps in meeting these requirements by continuously reducing the transistor channel length and oxide thickness. However, it brings new challenges, the most important of which is the decreasing supply voltage [2] [3].…”
Section: Introductionmentioning
confidence: 99%
“…In the literature, we can find several bootstrapped switch designs [3]- [9]. Each one was designed for a specific application with respect to a given technology.…”
Section: Introductionmentioning
confidence: 99%