2006
DOI: 10.1016/j.jcrysgro.2005.10.094
|View full text |Cite
|
Sign up to set email alerts
|

Designing novel organogermanium OMVPE precursors for high-purity germanium films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
16
0

Year Published

2007
2007
2019
2019

Publication Types

Select...
6
3

Relationship

1
8

Authors

Journals

citations
Cited by 33 publications
(16 citation statements)
references
References 4 publications
0
16
0
Order By: Relevance
“…These XPS results are consistent with prior secondary ion mass spectrometry (SIMS) results of no carbon in Ge/SiGe/Si films grown using MOVPE and IBGe as Ge source. These results are achieved during the collaborative development work [1,2] by Rohm and Haas Electronic Materials LLC, USA, and CNRS-LPN, France, the details of which are described in the next section.…”
Section: Assessment Of Alternative Safer Liquid Germanium Precursorsmentioning
confidence: 99%
See 1 more Smart Citation
“…These XPS results are consistent with prior secondary ion mass spectrometry (SIMS) results of no carbon in Ge/SiGe/Si films grown using MOVPE and IBGe as Ge source. These results are achieved during the collaborative development work [1,2] by Rohm and Haas Electronic Materials LLC, USA, and CNRS-LPN, France, the details of which are described in the next section.…”
Section: Assessment Of Alternative Safer Liquid Germanium Precursorsmentioning
confidence: 99%
“…Strategic use of graded SiGe buffer layers has effectively surmounted the tribulations associated with significant mismatch in lattice constants of direct band-gap III-V semiconductors (particularly GaAs) and silicon. These achievements have thus triggered new potential opportunities of complete single-chip optoelectronic integration of high-speed Si and/or SiGe processors with high bandwidth III-V lasers, for the most part using the same metalorganic vapor-phase epitaxy (MOVPE) reactor to afford highly reliable and economical solid-state semiconducting lasers [1,2]. In unison to this evolution, strained silicon (e-Si) has also been acknowledged as the prime candidate for next generation complementary metal-oxide-semiconductor (CMOS) field effect transistor (FET) technology.…”
mentioning
confidence: 99%
“…When we use a conventional MOVPE reactor, sometimes it is difficult to introduce monogermane (GeH 4 ) widely used in CVD system as a Ge precursor since GeH 4 is a self-decomposable and explosive material. There are some reports on using metal-organic Ge precursors such as tert-butyl germane [20] and iso-butyl germane (IBGe) [21]- [23]; these materials can be easily introduced into MOVPE systems. We used IBGe as a precursor to fabricate Ge buffer layers and conventional precursors (TEGa, TMIn, and AsH 3 ) for III-V compound semiconductors.…”
Section: Introductionmentioning
confidence: 99%
“…There are several possible reasons for this memory effect: Ge deposition on the reactor walls, Ge deposition inside the gas delivery and exhaust system, or simply, diffusion of Ge within the structure. Specifically, iso-butyl germane (IBGe) with its high vapor pressure [2] has the tendency to show a strong memory effect. Ge on the reactor walls can re-evaporate at the growth temperature and be incorporated into the layers grown.…”
Section: Introductionmentioning
confidence: 99%