Detection of X‐Rays by Solution‐Processed Cesium‐Containing Mixed Triple Cation Perovskite Thin Films

Basiricò, Laura; Senanayak, Satyaprasad P.; Ciavatti, Andrea; Abdi‐Jalebi, Mojtaba; Fraboni, Beatrice; Sirringhaus, Henning

doi:10.1002/adfm.201902346

Cited by 89 publications

(100 citation statements)

References 46 publications

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“…Layers 3.7 µm thick were found to provide the required mechanical flexibility without compromising the performance of the X-ray detector. The flexible X-ray detectors exhibited various attractive features including, a sensitivity of 59.9 µC Gy air −1 cm −2 , which is close to the highest values reported to date for triple cation perovskite sensing elements, [122] and low operating voltage (0.1 V). Another attractive characteristic is the enhanced stability under X-ray illumination and accumulative exposure of 4 Gy air for 1 h without encapsulation.…”

Section: Large-area Perovskite-based Direct X-ray Detectorssupporting

confidence: 69%

Metal Halide Perovskites for High‐Energy Radiation Detection

et al. 2020

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Metal halide perovskites (MHPs) have emerged as a frontrunner semiconductor technology for application in third generation photovoltaics while simultaneously making significant strides in other areas of optoelectronics. Photodetectors are one of the latest additions in an expanding list of applications of this fascinating family of materials. The extensive range of possible inorganic and hybrid perovskites coupled with their processing versatility and ability to convert external stimuli into easily measurable optical/electrical signals makes them an auspicious sensing element even for the high-energy domain of the electromagnetic spectrum. Key to this is the ability of MHPs to accommodate heavy elements while being able to form large, high-quality crystals and polycrystalline layers, making them one of the most promising emerging X-ray and-ray detector technologies. Here, the fundamental principles of high-energy radiation detection are reviewed with emphasis on recent progress in the emerging and fascinating field of metal halide perovskite-based X-ray and-ray detectors. The review starts with a discussion of the basic principles of high-energy radiation detection with focus on key performance metrics followed by a comprehensive summary of the recent progress in the field of perovskite-based detectors. The article concludes with a discussion of the remaining challenges and future perspectives.

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Section: Large-area Perovskite-based Direct X-ray Detectorssupporting

confidence: 69%

Metal Halide Perovskites for High‐Energy Radiation Detection

et al. 2020

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“…[ 23,24 ] Since then, X‐ray detection using many Pb‐based perovskites has been demonstrated. [ 25–40 ] To replace the toxic Pb, X‐ray detectors employing (C 8 H 17 NH 3 ) 2 SnBr 4 , [ 41 ] Cs 2 AgBiBr 6 , [ 42–45 ] Cs 3 Bi 2 I 9 , [ 46–48 ] (NH 4 ) 3 Bi 2 I 9 , [ 49 ] (BA) 2 CsAgBiBr 7 , [ 50 ] and Cs 2 TeI 6 [ 51 ] have been reported to demonstrate good sensitivity, and most of them significantly outperform the commercial α‐Se X‐ray detectors. However, some problems such as high‐temperature preparation, a large number of crystal defects, poor uniformity, low resistivity, and high leakage current, serious ion migration and instability are still serious enough to hamper their application in devices.…”

Section: Introductionmentioning

confidence: 99%

Large Lead‐Free Perovskite Single Crystal for High‐Performance Coplanar X‐Ray Imaging Applications

Liu

Zhang

Yang

et al. 2020

Advanced Optical Materials

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The capability to detect radiation signal like X-rays and gamma-rays has been improved dramatically in recent years. [1,2] X-ray detection is very important because of its wide range of applications in medical imaging, industrial monitoring, national security, environmental protection and remediation, and science research. In particular, flat-panel X-ray detector array is now playing an important role in in modern medical, security verification, and industrial production. [3,4] Among the materials developed for X-ray detectors, amorphous selenium (a-Se) becomes the most classic semiconductor material for direct X-ray detection (X-rays directly convert into current signals), and it is suitable for X-ray imaging because of its easy deposition process on large-scale flat-panel digital readout circuits. [5,6] Unfortunately, the conversion efficiency of a-Se is limited due to its low X-ray absorbance, caused by its low atomic number (Z = 34), accompanied by small carrier mobility and lifetime product (μτ) value of ≈10 −7 cm 2 V −1 , which leads to its very low sensitivity (440 μC Gy air −1 cm −2) even under high operating electric field (15 000 V mm −1). [7] In addition to the a-Se, many other traditional semiconductors, such as Si, [8,9] TlBr, [10,11] PbI 2 , [12,13] Ge, [14,15] HgI 2 , [16,17] CdZnTe, [18,19] and PbO, [20,21] have been well studied, and among of them, especially CdZnTe, has shown potential applications in commercial X-ray detectors. However, most of these materials either possess very high dark current and low sensitivity, or suffer from needing high-temperature (exceeding 500 °C) and complex growth equipment, let alone their high toxicity (cadmium (Cd), thallium (Tl), lead (Pb), and mercury (Hg)). Accordingly, there are still some difficulties in preparing a large area X-ray absorber layer with excellent uniformity at low temperature, limiting their application to mammography. Therefore, recently, low-temperature, solution-synthesized 60 μm thick polycrystalline methylammonium lead iodide CH 3 NH 3 PbI 3 (MAPbI 3) perovskite films have been prepared to detect 8 keV low energy X-rays with high sensitivity, and X-ray imaging was demonstrated on a photovoltaic device. [22] Later, Huang's group achieved sensitive X-ray imaging by integrating MAPbBr 3 single crystals (SCs) on a silicon substrate. [23,24] Since then, X-ray detection using many Pb-based perovskites Lead-based (Pb) perovskite recently emerged as a promising photoelectric material for direct ionization radiation detection with outstanding performance. Unfortunately, its application is limited due to its toxicity caused by high Pb content, serious ion migration, poor crystallite quality, unsatisfactory reproducibility, high resistivity, and large fluctuation of electronic properties. Herein, a better substitute of lead-free inch-sized (34.3 mm × 34.3 mm × 13.1 mm) high-quality halide (CH 3 NH 3) 3 Bi 2 I 9 single crystal (MA 3 Bi 2 I 9 SC) is presented with higher resistivity, lower ion migration, and better stability. The coplanar detector ...

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“…[11] Moreover, these materials were conceived to act as an active layer for X-ray detectors due to the high absorption arising from the high-Z atoms. [12][13][14][15][16][17][18][19] Owing to these beneficial characteristics, when perovskite materials are utilized in devices based on direct X-ray detection mode, [20][21][22][23][24][25][26] simpler system configuration compared to scintillators can be achieved. [27] However, commercial X-ray detectors rely mostly on indirect bandgap materials to mitigate the light interference, as medical diagnostics and other industrial applications require high sensitivity, which can only be attained at a high signal-to-noise ratio.…”

Section: Introductionmentioning

confidence: 99%

Identifying Carrier Behavior in Ultrathin Indirect‐Bandgap CsPbX₃ Nanocrystal Films for Use in UV/Visible‐Blind High‐Energy Detectors

Xin

Alaal

Mitra

et al. 2020

Small

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and military devices. Among these applications, medical diagnostics is particularly significant, but it presently requires direct exposure to high doses of radiation, which is harmful to human health, increasing cancer risk, especially in children. [1,2] Hence, X-ray detectors possessing both high sensitivity and high resolution with a low light interface noise [3,4] are required to minimize the radiation exposure during routine medical diagnostics. In the pertinent literature, use of conventional semiconductors for direct X-ray detection has been reported by several groups, including amorphous Se, [5] crystalline Si, [6] Ge, [7] HgI 2 , [8] CdTe, [9,10] and CdZnTe, [9,10] indicating that the most effective materials are indirect bandgap semiconductors [5-10] that exhibit low light interference noise. However, as such devices possess low sensitivity due to the low atomic number values of their materials, [7] as well as they still require expensive fabrication and complex processing methods, there is a high industrial demand for cost-effective highly sensitive X-ray detectors that are more suited for mass production. Ionic perovskite crystals can be processed from solution at low temperatures, in contrast to covalent bond semiconductors, which require a high-temperature crystallization process. Consequently, lead halogen perovskite has emerged as a promising candidate due to its cost-effectiveness, high crystal quality, high absorption cross-section, high illumination, and ability to form High-energy radiation detectors such as X-ray detectors with low light photoresponse characteristics are used for several applications including, space, medical, and military devices. Here, an indirect bandgap inorganic perovskite-based X-ray detector is reported. The indirect bandgap nature of perovskite materials is revealed through optical characterizations, time-resolved photoluminescence (TRPL), and theoretical simulations, demonstrating that the differences in temperature-dependent carrier lifetime related to CsPbX 3 (X = Br, I) perovskite composition are due to the changes in the bandgap structure. TRPL, theoretical analyses, and X-ray radiation measurements reveal that the high response of the UV/visible-blind yellow-phase CsPbI 3 under high-energy X-ray exposure is attributed to the nature of the indirect bandgap structure of CsPbX 3. The yellowphase CsPbI 3-based X-ray detector achieves a relatively high sensitivity of 83.6 μCGy air −1 cm −2 (under 1.7 mGy air s −1 at an electron field of 0.17 V μm −1 used for medical diagnostics) although the active layer is based solely on an ultrathin (≈6.6 μm) CsPbI 3 nanocrystal film, exceeding the values obtained for commercial X-ray detectors, and further confirming good material quality. This CsPbX 3 X-ray detector is sufficient for cost-effective device miniaturization based on a simple design.

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Detection of X‐Rays by Solution‐Processed Cesium‐Containing Mixed Triple Cation Perovskite Thin Films

Cited by 89 publications

References 46 publications

Metal Halide Perovskites for High‐Energy Radiation Detection

Metal Halide Perovskites for High‐Energy Radiation Detection

Large Lead‐Free Perovskite Single Crystal for High‐Performance Coplanar X‐Ray Imaging Applications

Identifying Carrier Behavior in Ultrathin Indirect‐Bandgap CsPbX₃ Nanocrystal Films for Use in UV/Visible‐Blind High‐Energy Detectors

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Detection of X‐Rays by Solution‐Processed Cesium‐Containing Mixed Triple Cation Perovskite Thin Films

Cited by 89 publications

References 46 publications

Metal Halide Perovskites for High‐Energy Radiation Detection

Metal Halide Perovskites for High‐Energy Radiation Detection

Large Lead‐Free Perovskite Single Crystal for High‐Performance Coplanar X‐Ray Imaging Applications

Identifying Carrier Behavior in Ultrathin Indirect‐Bandgap CsPbX3 Nanocrystal Films for Use in UV/Visible‐Blind High‐Energy Detectors

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Identifying Carrier Behavior in Ultrathin Indirect‐Bandgap CsPbX₃ Nanocrystal Films for Use in UV/Visible‐Blind High‐Energy Detectors