1999
DOI: 10.1109/2944.814989
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Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser

Abstract: Abstract-We report the measurement of the optical constants of Si, GaP, InP, GaAs, GaAsP, and Ir at a wavelength of 46.9 nm (26.5 eV). The optical constants were obtained from the measurement of the variation of the reflectivity as a function of angle utilizing, as an illumination source, a discharge pumped 46.9-nm table-top laser operated at a repetition rate of 1 Hz. These measurements constitute the first application of an ultrashort wavelength laser to materials research.Index Terms-Soft X-ray laser, XUV o… Show more

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Cited by 36 publications
(12 citation statements)
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“…The 25-80 nm wavelength region is of particular relevance to many rapidly growing technological and scientific fields, such as solar physics [1,2] synchrotron and free electron laser facilities [3] and other EUV sources such as table-top capillary discharge lasers [4]. Some applications of EUV sources emitting in the 25-80 nm wavelength range include plasma physics [5], the characterization of materials and optical elements [6,7] materials damage [3], photochemistry of biological molecules [8], nanopatterning [9], and ultrafast single-shot microscopy [10].…”
Section: Introductionmentioning
confidence: 99%
“…The 25-80 nm wavelength region is of particular relevance to many rapidly growing technological and scientific fields, such as solar physics [1,2] synchrotron and free electron laser facilities [3] and other EUV sources such as table-top capillary discharge lasers [4]. Some applications of EUV sources emitting in the 25-80 nm wavelength range include plasma physics [5], the characterization of materials and optical elements [6,7] materials damage [3], photochemistry of biological molecules [8], nanopatterning [9], and ultrafast single-shot microscopy [10].…”
Section: Introductionmentioning
confidence: 99%
“…The measurements of the optical constants of InP and GaAsP constitute, to the best of our knowledge, the first experimental values at this wavelength, while for the rest of the materials, the values obtained are in most cases in good agreement with tabulated values. These measurements and the analysis of the data are discussed in more detail in a recent paper [17].…”
Section: Recent Progress In X-ray Lasersmentioning
confidence: 99%
“…The application of this laser to plasma shadowgraphy [8] and soft X-ray reflectometry for the determination of optical constants [9] has been discussed in recent publications.…”
Section: Applicationsmentioning
confidence: 99%