2007
DOI: 10.1116/1.2709896
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Development of a high-resolution active-matrix electron emitter array for application to high-sensitivity image sensing

Abstract: Articles you may be interested inActive-matrix Spindt-type field emitter array with faster response time for image sensor with high-gain avalanche rushing amorphous photoconductor target J. Vac. Sci. Technol. B 33, 012205 (2015); 10.1116/1.4906103 2 ∕ 3 in. ultrahigh-sensitivity image sensor with active-matrix high-efficiency electron emission device J. Vac. Sci. Technol. B 28, C2D11 (2010); 10.1116/1.3271163 640 × 480 pixel active-matrix Spindt-type field emitter array image sensor with high-gain avalanche ru… Show more

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Cited by 9 publications
(2 citation statements)
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References 12 publications
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“…Planar metal-oxide-semiconductor (MOS) electron emission devices have excellent attributes, such as a low driving voltage, they function at low , and atmospheric pressures , and in liquids, and have a low divergence angle for the electron beam . Several practical applications have been proposed, including in field emission displays, , in highly sensitive image sensors, and for electron beam lithography systems. The electron emission source plays a critical role in the performance of electron microscopy setups, such as scanning electron microscopes (SEM), transmission electron microscopes (TEM), and electron beam lithography. Compared with Schottky-type electron sources and tungsten field emitters, MOS-type electron emission devices are disadvantaged by their broad emitted electron energy spread.…”
Section: Introductionmentioning
confidence: 99%
“…Planar metal-oxide-semiconductor (MOS) electron emission devices have excellent attributes, such as a low driving voltage, they function at low , and atmospheric pressures , and in liquids, and have a low divergence angle for the electron beam . Several practical applications have been proposed, including in field emission displays, , in highly sensitive image sensors, and for electron beam lithography systems. The electron emission source plays a critical role in the performance of electron microscopy setups, such as scanning electron microscopes (SEM), transmission electron microscopes (TEM), and electron beam lithography. Compared with Schottky-type electron sources and tungsten field emitters, MOS-type electron emission devices are disadvantaged by their broad emitted electron energy spread.…”
Section: Introductionmentioning
confidence: 99%
“…To alleviate this problem, active matrix FEA has recently been developed, where each pixel is addressed through a transistor. 12,13 Compared to existing AMFPI, SAPHIRE has the following advantages: ͑1͒ Programmable avalanche gain g av ensures a wide dynamic range. By increasing the electric field E Se , high g av can be applied at low dose applications ͑e.g., fluoroscopy or tomosynthesis͒ to achieve x-ray quantum noise limited performance, while g av is turned off at high dose ͑e.g., radiography͒.…”
Section: Introductionmentioning
confidence: 99%