2012
DOI: 10.4028/www.scientific.net/amr.468-471.1128
|View full text |Cite
|
Sign up to set email alerts
|

Development of a Practical Scanning Acoustic Microscopy

Abstract: Scanning acoustic microscopy (SAM) is a powerful non-destructive testing tool used in electronic, material and medical testing area. Commercial SAM products are generally too expensive to be extended to common users. Therefore, a practical SAM system had been developed using high-frequency ultrasonic focus transducers, a wide-band pulse transmitter/receiver, a high-speed data acquisition card, and a high-precision motion system. The SAM system's precision and function can meet the requirement of practical test… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2013
2013
2014
2014

Publication Types

Select...
3
1

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 4 publications
0
2
0
Order By: Relevance
“…A gating system selects useful recieved signals to display. This transmit-receive-gate-display process is replicated hundreds of times over as the transducer passes over the sample line-by-line and then an acoustic C-scan image of the sample is created by the computer [8]. The appearence of SAM system is shown in Fig.…”
Section: Applied Mechanics and Materials Vols 536-537mentioning
confidence: 99%
“…A gating system selects useful recieved signals to display. This transmit-receive-gate-display process is replicated hundreds of times over as the transducer passes over the sample line-by-line and then an acoustic C-scan image of the sample is created by the computer [8]. The appearence of SAM system is shown in Fig.…”
Section: Applied Mechanics and Materials Vols 536-537mentioning
confidence: 99%
“…The scanning acoustic microscopy (SAM) is potential non-destructive testing equipment, which takes advantage of high-frequency focused ultrasonic to detect the internal and sub-surface structure of specimens non-destructively [1] . It can not only detect micron flaws at different depths (from surface to tens of millimeters depth) with high sensitivity and high precision, but also be used for the detection of film because of the superiority of time-resolving ability [2] . In this paper, we proposed a method to determine the properties of film by high-frequency ultrasonic based on the SAM.…”
Section: Introductionmentioning
confidence: 99%