International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)
DOI: 10.1109/test.1999.805623
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DFT advances in the Motorola's MPC7400, a PowerPC/sup TM/ G4 microprocessor

Abstract: Several advances have been made in the Design for Testability of the MPC7400, the first fourth generation PowerPC microprocessor. The memory Array Built-In Self Test (ABIST) algorithms now support detecting write-recovery defects and more comprehensive diagnostics. Delay defects can be tested with scan patterns with the Phased Locked Loop (PLL) providing the at-speed launch-capture events. Several methodology and modeling improvements increased LSSD stuck-at fault test coverage. Design forManufacturability enh… Show more

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Cited by 24 publications
(5 citation statements)
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“…Since CPUs are the major source of power consumption in DCSs [4], many microprocessor manufacturers including Intel, AMD, Motorolla and Transmeta have put a lot of effort into low-power processor design focusing on DVFS [15,[20][21][22]. DVFS is a promising energy saving technique that can be incorporated into scheduling; and many scheduling algorithms (e.g., [5,23]) using DVFS have been proposed for different problems.…”
Section: Scheduling In Hcssascheduling With Energy Consciousnessmentioning
confidence: 99%
“…Since CPUs are the major source of power consumption in DCSs [4], many microprocessor manufacturers including Intel, AMD, Motorolla and Transmeta have put a lot of effort into low-power processor design focusing on DVFS [15,[20][21][22]. DVFS is a promising energy saving technique that can be incorporated into scheduling; and many scheduling algorithms (e.g., [5,23]) using DVFS have been proposed for different problems.…”
Section: Scheduling In Hcssascheduling With Energy Consciousnessmentioning
confidence: 99%
“…Like the MPC74xx microprocessors [3,5,7], the e500 core has implemented DFT features that supports at-speed delay fault testing using a tester that runs at much slower speeds than the microprocessor speed. Highlights of design The test is initiated by an asynchronous, non timing critical signal.…”
Section: Deterministic At-speed Delay Fault Testingmentioning
confidence: 99%
“…The design supports both broad side transition fault test patterns and path delay test patterns [3,5,7]. Several enhancements were made to the ATPG tool to support the at-speed clocking, improve ATPG run time and increase the test coverage for transition fault test patterns [7].…”
Section: Paper 211mentioning
confidence: 99%
“…The broad-side test structure is used to allow at-speed transition fault testing on the slower testers for Motorola microprocessor designs using PowerPC compliant instruction sets architecture [11,7]. A flexible clocking control was implemented in Motorola MPC7400 design to allow use of the PLL for issuing a variety of launch/capture events for broad-side transition test.…”
Section: Transition Test Needs Two Vectorsmentioning
confidence: 99%