Differential Open Resonator Method for Permittivity Measurements of Thin Dielectric Film on Substrate

Dudorov, Sergey; Lioubtchenko, Dmitri; Mallat, Juha; Räisänen, Antti V.

doi:10.1109/tim.2005.853352

Cited by 18 publications

(14 citation statements)

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“…At Colorado school of Mines (CSM) we use 3 mm wave (or sub‐THz) modalities to extract material properties: (1) a quasioptical system, [ Scales and Batzle , , ; Greeney and Scales , ] to study bulk properties; (2) a near‐field scanning system [ Weiss et al , ], to measure local properties; and (3) the open hemispherical cavity resonator [ Rahman et al , ; Dudorov et al , ], for samples that are too thin or too low loss for quasioptical techniques. In this work, using cavity resonance perturbation (Figure ), we extract the complex dielectric constants of clay‐thin films in 100–165 GHz and investigate electrical properties in the presence of Ca ++ /Na + ions.…”

Section: Methodsmentioning

confidence: 99%

Sub‐THz complex dielectric constants of smectite clay thin samples with Na⁺/Ca⁺⁺ ions

2015

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We implement a technique to characterize the electromagnetic properties at frequencies 100 to 165 GHz (3 cm−1 to 4.95 cm−1) of oriented smectite samples using an open cavity resonator connected to a submillimeter wave VNA (Vector Network Analyzer). We measured dielectric constants perpendicular to the bedding plane on oriented Na+ ion and Ca++ ion stabilized smectite samples deposited on a glass slide at ambient laboratory conditions (room temperature and room light). The clay layer is much thinner (∼30 μm) than the glass substrate (∼2.18 mm). The real part of dielectric constant, ϵre, is essentially constant over this frequency range but is larger in Na+ ion than in Ca++ ion infused clay. The total electrical conductivity (associated with the imaginary part of dielectric constant, ϵim) of both samples increases monotonically at lower frequencies (<110 GHz) but shows rapid increase for Na+ ions in the regime > 110 GHz. The dispersion of the samples display a dependence on the ionic strength in the clay interlayers, i.e., ζ potential in the Stern layers.

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Section: Methodsmentioning

confidence: 99%

Sub‐THz complex dielectric constants of smectite clay thin samples with Na⁺/Ca⁺⁺ ions

2015

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“…while β 01 is the waveguide-cavity factor as reported in [5] and Z g represents the characteristic impedance of the transmission line equivalent to the rectangular waveguide excited in its fundamental mode TE 10 .…”

Section: Equivalent Circuit Model Of Open Resonator System For the Chmentioning

confidence: 99%

“…They include open-ended waveguide/coaxial probe methods [18], free-space techniques [16], stripline [20], transmission/reflection [4] and resonant [22] procedures, all having specific advantages and constraints. Among them, open resonator methods [10,11,13,15,17,25] give the most powerful tool to accurately retrieve the equivalent impedance properties of low-loss thin dielectric surfaces. In the standard resonator approach [25], approximate empirical formulas are adopted to obtain the surface impedance characterization from the knowledge of measured resonance parameters, such as the frequency shift and the cavity quality factor.…”

Section: Introductionmentioning

confidence: 99%

Microwave Open Resonator Techniques – Part II: Applications

Costanzo¹,

Massa²,

Moreno³

2012

Microwave Materials Characterization

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“…Various methods have been developed in millimeter and submillimeter frequency ranges to measure material properties (usually complex permittivity and permeability), e.g., the open resonator [3,4], free space [5][6][7][8][9][10], and reflection ellipsometry methods [11][12][13]. The open resonator method provides accurate material properties at discrete resonance frequencies.…”

Section: Introductionmentioning

confidence: 99%

“…Their bandwidths have been broadening and operating frequency bands have been moving to the submillimeter frequency range. Measurements of the electrical properties of EM materials have gained considerable importance, particularly in the millimeter and submillimeter frequency ranges, as material parameters are fundamental parameters in the natural and application sciences fields [1,2].Various methods have been developed in millimeter and submillimeter frequency ranges to measure material properties (usually complex permittivity and permeability), e.g., the open resonator [3,4], free space [5][6][7][8][9][10], and reflection ellipsometry methods [11][12][13]. The open resonator method provides accurate material properties at discrete resonance frequencies.…”

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confidence: 99%

Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range

Kang

Kim

Kang³

et al. 2018

J Electromagn Eng Sci

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I. INTRODUCTIONRecently, uses and applications of electromagnetic (EM) materials, devices, and systems have been becoming more popular in the fields of both the natural sciences, such as physics, chemistry, biology, earth science, and astronomy, and the application sciences, such as telecommunications, military, defense, security, transportation, and medicine. Their bandwidths have been broadening and operating frequency bands have been moving to the submillimeter frequency range. Measurements of the electrical properties of EM materials have gained considerable importance, particularly in the millimeter and submillimeter frequency ranges, as material parameters are fundamental parameters in the natural and application sciences fields [1,2].Various methods have been developed in millimeter and submillimeter frequency ranges to measure material properties (usually complex permittivity and permeability), e.g., the open resonator [3,4], free space [5][6][7][8][9][10], and reflection ellipsometry methods [11][12][13]. The open resonator method provides accurate material properties at discrete resonance frequencies. The free space method is based on the quasi-optic approach where the material under test (MUT) is coupled to transmit (Tx) and This paper describes specular reflectance measurements of dielectric plates in three waveguide frequency bands: D-band (110-170 GHz), G-band (140-220 GHz), and J-band (220-325 GHz). The transmit (Tx) part of the proposed specular reflectance measurement system is stationary, while the receive (Rx) part and the material under test (MUT) holder are concentric-rotating with a 2:1 speed ratio for specular reflectance measurements. In specular reflectance measurements, the first step measures the specular reflection coefficients of an MUT and a metal plate on the MUT holder located at the center of the Tx and Rx parts, and the second step calculates the specular reflectance defined by the specular reflection power (i.e., intensity) of the MUT normalized to that of the metal plate. Multiple reflection effects between the Tx and Rx antennas and the MUT on the measured specular reflectance are minimized by averaging out the multiple specular reflectances measured with changing the separation distance between the two antennas by λ/8 intervals. Measurement results of the perpendicular-polarized specular reflectance of commonly used dielectric plates are verified by comparing those with the analytic results and show that the results measured over the overlapped frequency range of the D-/G-bands and at the boundary frequency of the G-/J-bands agree well with the results for the other band, respectively. This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited. ⓒ

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Differential Open Resonator Method for Permittivity Measurements of Thin Dielectric Film on Substrate

Cited by 18 publications

References 4 publications

Sub‐THz complex dielectric constants of smectite clay thin samples with Na⁺/Ca⁺⁺ ions

Sub‐THz complex dielectric constants of smectite clay thin samples with Na⁺/Ca⁺⁺ ions

Microwave Open Resonator Techniques – Part II: Applications

Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range

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Differential Open Resonator Method for Permittivity Measurements of Thin Dielectric Film on Substrate

Cited by 18 publications

References 4 publications

Sub‐THz complex dielectric constants of smectite clay thin samples with Na+/Ca++ ions

Sub‐THz complex dielectric constants of smectite clay thin samples with Na+/Ca++ ions

Microwave Open Resonator Techniques – Part II: Applications

Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range

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Sub‐THz complex dielectric constants of smectite clay thin samples with Na⁺/Ca⁺⁺ ions

Sub‐THz complex dielectric constants of smectite clay thin samples with Na⁺/Ca⁺⁺ ions