1982
DOI: 10.1007/bf03216567
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Diffusion barriers between gold and semiconductors

Abstract: The effectiveness of a number ofsemiconductor devices depends on the efficiency with which interdiffusion between the semiconductor and metals, which must be applied to it either as contacts or conductive ijietallizations, can be blocked. Comparisons of the characteristics of the diffusion hamers which can be used between gold and semiconductors -such as those which are made here -therefore have considerable significance.

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Cited by 11 publications
(9 citation statements)
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“…In addition, the 5 nm W adhesion layer is the best of all 5 nm adhesion layers studied by a significant margin. Previous studies have shown that W does not readily diffuse into Au even after annealing at 300 °C, and hence there is no dramatic fall-off in stability when using thicker W adhesion layers …”
Section: Resultsmentioning
confidence: 99%
“…In addition, the 5 nm W adhesion layer is the best of all 5 nm adhesion layers studied by a significant margin. Previous studies have shown that W does not readily diffuse into Au even after annealing at 300 °C, and hence there is no dramatic fall-off in stability when using thicker W adhesion layers …”
Section: Resultsmentioning
confidence: 99%
“…It has been proved that, during thermally depositing a metal electrode under high vacuum, the metal would diffuse into the predeposited organic semiconductor layer, which produced remarkable effects on the performance of the semiconductor device. In order to prevent the evaporation metal from diffusing to the photoactive layer, thus affecting the dark current density of the NIR organic photodiodes, Xiong et al employed a transfer-printed conducting polymer (tp-CP) as the top electrode of the NIR photoresponsive low-bandgap polymers (PMDPP3T) based organic photodiodes . The device structure is expressed as glass/ITO/PEIE/PMDPP3T:PC61BM/PEDOT:PSS.…”
Section: Exploration Of Nir Opds With Excellent Performancementioning
confidence: 99%
“…The far left Au nanoparticle in Figure a appears to have not lost gold to the surrounding a-Si matrix. This suggests that the diffusion process may be affected by many factors such as local density, defect states, and degree of crystallinity within the a-Si layer …”
Section: Resultsmentioning
confidence: 99%
“…This suggests that the diffusion process may be affected by many factors such as local density, defect states, and degree of crystallinity within the a-Si layer. 47 Plan-View STEM−EELS Analysis. A HAADF STEM image of the aSi/AuNP25nm sample in plan-view geometry is shown in Figure 4a.…”
Section: ■ Results and Discussionmentioning
confidence: 99%