In sub/near-threshold operation, SRAMs suffer from considerable bit-line swing degradation when the data pattern of a column is skewed to "1" or "0". The worst scenariosregarding this problemoccur when the currently readSRAM cell has different data compared to the rest cells onthe same column. In this work, we overcome this challenge by using a column-based randomization engine(CBRE).ThisCBREcircuit randomizesdata stored to SRAM. This makes distribution of "1" and "0" in each column close to 50%, significantlyincreasingbit-line swing. To further improve the bit-line swing, we employ bit-line boost biasing and dynamic bit-line keeper schemes. Based on the mentioned techniques, we fabricateda 256 rows × 128 columns (32Kb)8T SRAM array in 65 nm CMOS technology.In our silicon measurement, the SRAM array shows successful 200mVoperation at room temperate, where energy consumption and access time are1 pJ and 2.5 µs, respectively.