Direct determination of impurities in high purity silicon carbide by inductively coupled plasma optical emission spectrometry using slurry nebulization technique

Abstract

A novel method for the determination of Al, Ca, Cr, Cu, Fe, Mg, Mn, Ni and Ti in high purity silicon carbide (SiC) using slurry introduction axial viewed inductively coupled plasma optical emission spectrometry (ICP-OES) was described. The various sizes of SiC slurry were dispersed by adding dispersant polyethylene imine (PEI). The stability of slurry was characterized by zeta potential measurement, SEM observation and signal stability testing. The optimal concentration of PEI was found to be 0.5 wt% for the SiC slurry. Analytical results of sub-m size SiC by the slurry introduction were in good accordance with those by the alkaline fusion method which verified that determination could be calibrated by aqueous standards. For m size SiC, results of most elements have a negative deviation and should be calibrated by the Certified Reference Material slurry. Owing to a rather low contamination in the sample preparation and stability of the slurry, the limits of detection (LODs), which are in the range of 40-2000 ng g −1 , superior to those of the conventional nebulization technique by ICP-OES or ICP-MS.

Determination of trace elements in silicon powder using slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry

“…Solid sampling graphite furnace atomic absorption spectrometry and solid sampling electrothermal vaporization ICP-MS/ICP-OES have been successfully applied for the determination of trace elements in silicon samples. [2][3][4] ETV method has been used for the sample introduction of difficult to dissolve samples. 5,6 The ETV-ICP-MS method has the advantages of multi-elemental capability and better detection power over GFAAS method.…”

Determination of Manganese in Cassava Leaves by Slurry Sampling Flame Atomic Absorption Spectrometry

“…Since it does not usually require special apparatus, it reduces manipulation of the sample, obtaining lower contamination problems and a reduction in the sample preparation time (Magalhã es and Arruda 1998). Solid analysis in inductively coupled plasma optical emission spectrometry (ICP OES) for slurry sampling has been extensively researched over the last eighteen years (Docekal et al 1992;Anzano et al 2000;Barnett et al 1991;Ebdon, Foulkes, and Sutton 1997;Wang et al 2006). The electrothermal atomic absorption spectrometry associated with slurry sampling has been successfully used for analysis of an ample variety of samples (Viñ nas et al 1995;Januzzi, Krug, and Arruda 1997;Lü cker 1999;Vassileva, Baeten, and Hoening 2001) and ICP mass spectrometry (Maia, Pozebon, and Curtius 2003;Ni, Liu, and Jang 2005;Li and Jiang 2006).…”

Analysis of rice and wheat flour by particle nebulization ICP-MS

“…25 Compared with the LA sampling technique, the advantage of slurry nebulization is that it has the potential for direct calibrations with conventional aqueous standards using a solution nebulization introduction system. 26 Some applications of slurry nebulization ICPoptical emission spectrometry (ICP-OES) technique for the analysis of the geological and inorganic material samples are reported; [27][28][29][30][31][32][33][34] however, the matrix effects in ICP-MS are much more serious than the ICP-OES technique. Recently, we have tried to use the slurry nebulization ICP-MS technique to measure the high eld strength elements (Nb, Ta, Zr, and Hf) in silicate rocks.…”