2007
DOI: 10.1016/j.ultramic.2007.01.003
|View full text |Cite
|
Sign up to set email alerts
|

Direct electron imaging in electron microscopy with monolithic active pixel sensors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
40
0

Year Published

2008
2008
2019
2019

Publication Types

Select...
4
4

Relationship

0
8

Authors

Journals

citations
Cited by 66 publications
(41 citation statements)
references
References 21 publications
1
40
0
Order By: Relevance
“…To reduce the impact of the noise while retaining the edge transition profile, we adapted an analytical fitting method (Yin, et al, 1990) and used the sum of two sigmoid curves (Deptuch, et al, 2007) to fit the edge profile:…”
Section: Resolution Of the Ddd Detectormentioning
confidence: 99%
See 2 more Smart Citations
“…To reduce the impact of the noise while retaining the edge transition profile, we adapted an analytical fitting method (Yin, et al, 1990) and used the sum of two sigmoid curves (Deptuch, et al, 2007) to fit the edge profile:…”
Section: Resolution Of the Ddd Detectormentioning
confidence: 99%
“…At 1/2 Nyquist frequency (50 lp/mm), the DDD showed a MTF of >12%. Comparing to the publicly available MTF data for Gatan scientific CCD cameras and another active pixel sensor based detector, the MIMOSA V chip (Deptuch, et al, 2007), it is quite clear that the DDD outperforms other technologies at the same spatial frequencies. This advantage does not show up in a plot using the usual scale of 1/pixel (see Figure 3b).…”
Section: Resolution Of the Ddd Detectormentioning
confidence: 99%
See 1 more Smart Citation
“…Commercial bulk CMOS is the most commonly adopted process for monolithic active pixel sensors (MAPS) [1]. MAPS are being successfully applied to particle physics experiments [2,3], imaging in transmission electron microscopy [4,5,6] and photon imaging [7]. However, MAPS in bulk CMOS technology have several limitations.…”
Section: Introductionmentioning
confidence: 99%
“…In TEM, replacing phosphorcoupled CCDs with direct detection on CMOS sensor is the latest trend in imaging [10,44,11], to decrease the PSF and enhance the detection quantum efficiency and imaging contrast ratio. Multiple scattering in the sensor is a major limitation, since the typical electron energy is in the range 60 -300 keV.…”
Section: Sensor Thicknessmentioning
confidence: 99%