Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface

Дроздов, М. Н.; Yunin, P. A.; Travkin, Vlad V.; Koptyaev, Andrey I.; Pakhomov, Georgy L.

doi:10.1002/admi.201900364

Cited by 13 publications

(13 citation statements)

References 37 publications

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“…[119] The migration of organic cation driven by the electric field was also observed in a lateral device Au/FAPbI 3 / Au. [120] ToF-SIMS chemical maps indicate that both PbI 3 − and FA + become inhomogeneous in the lateral device after electric poling, indicating the migration of PbI 3…”

Section: Electric Field Induced Ion Migrationmentioning

confidence: 99%

“…In addition, the Au moves beyond the nominal edge of electrodes and penetrates into the perovskite after electric poling, indicating a mutual mixing of the Au electrode and the perovskite at the interface during the electric poling. [120] Such diffusion of Au into perovskite was found to be detrimental to the fieldeffect transistors (FETs) based on MAPbBr 3 . [121] ToF-SIMS image (Figure 15) reveals an Au-rich layer in MAPbBr 3 underneath the Au anode after poling, suggesting an intermixing of Au and MAPbBr 3 due to electrochemical reaction between Au anode and MAPbBr 3 during the poling process.…”

Section: Electric Field Induced Ion Migrationmentioning

confidence: 99%

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Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Liu

Lorenz

Ievlev

et al. 2020

Adv Funct Materials

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Metal halide perovskite (MHP) solar cells have attracted much attention due to the rapidly growing power conversion efficiency that has reached 25.2% in a decade, comparable to established commercial photovoltaic modules. Compositional engineering is one of the most effective methods to boost the performance of MHP solar cells. Further improving the efficiency and the stability of MHP solar cells necessitates good understanding of the chemical–efficiency correlation and the chemical evolution during the degradation of MHP solar cells. In this regard, time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a powerful tool to investigate the chemical aspect of MHPs and has played an important role in advancing the development of MHP optoelectronics. However, up to date, a review that can guide future utilization of ToF‐SIMS in the MHP development is missing. Herein, the capabilities of ToF‐SIMS in MHP investigations are summarized and analyzed from simple material synthesis and chemical distribution to more complicated device operation mechanism and stability. The strength of ToF‐SIMS in resolving important issues in this field, such as interface composition, ion migration, and degradation in MHP is highlighted. Finally, an outlook with an emphasis on making the utmost of ToF‐SIMS in developing MHP devices is provided.

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Section: Electric Field Induced Ion Migrationmentioning

confidence: 99%

Section: Electric Field Induced Ion Migrationmentioning

confidence: 99%

Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Liu

Lorenz

Ievlev

et al. 2020

Adv Funct Materials

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“…As the PSC field has realized the powerful insight TOF-SIMS can yield in this materials system, TOF-SIMS data is becoming more commonly seen in the literature, and there are number of publications within the last year which utilize TOF-SIMS which were not otherwise discussed in detail in this review of the literature. [49][50][51][52][53][54][55][56][57][58][59][60] In this review article, we show examples of the basic types of data that can be obtained from TOF-SIMS analysis of PSC materials, and we also summarize updated best practices to identify and avoid TOF-SIMS measurement artifacts such as beam-damage accumulation, organic molecule fragmentation, and preferential sputtering.…”

Section: Introductionmentioning

confidence: 99%

Investigating the Effects of Chemical Gradients on Performance and Reliability within Perovskite Solar Cells with TOF‐SIMS

Harvey

Messinger

Zhu

et al. 2020

Advanced Energy Materials

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Time-of-flight secondary-ion mass spectrometry (TOF-SIMS), a powerful analytical technique sensitive to all components of perovskite solar cell (PSC) materials, can differentiate between the various organic species within a PSC absorber or a complete device stack. The ability to probe chemical gradients through the depth of a device (both organic and inorganic), with down to 100-nm lateral resolution, can lead to unique insights into the relationships between chemistry in the absorber bulk, at grain boundaries, and at interfaces as well as how they relate to changes in performance and/or stability. In this review, the authros briefly overview the technique; then, from the literature, several examples of how TOF-SIMS has been used to provide unique insight into PSC absorbers and devices are covered. Finally, the common artifacts that can be introduced if the data are improperly collected, as well as methods to mitigate these artifacts are discussed. due to stability improvements. 4,5,10,[13][14][15] Historically, the most commonly studied PSCs are of the form 3 . Despite the promise of PSCs, several barriers to broad commercial adoption remain.Key issues include unstable interfaces in PSC devices, solvent-exchange engineering, hysteresis and light soaking, narrow spectral absorption, and (perhaps) the need to reduce lead content. 4,5,12,13,[16][17][18][19][20] Attempts by the scientific community to address PSC stability through passivation of internal defects and interfaces have led to increasingly complex composition schemes and passivating additives. Many groups have studied PSC stability and proposed perovskite composition solutions, but the details of the fundamental degradation mechanisms are still difficult to remedy. The literature has identified moisture penetration into the lattice, oxidation, photo-induced reactions, temperature, and halogen diffusion, particularly at device surfaces and interfaces, as the most relevant degradation pathways. 4,5,13,17 Developing a robust toolkit of advanced characterization methods and techniques is crucial for further improvements in PSC technology. Other advanced

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“…The preparation of the multilayer cells by the vacuum deposition technique is described previously. [9,10] The schematic of cells is shown in Figure 1. Initially, the cell with cuprous iodide CuI as a hole-transporting layer (HTL) were obtained following the technological concept arisen in Refs.…”

Section: Methodsmentioning

confidence: 99%

NIR Photoresponse of Perovskite Solar Cells with Titanyl Phthalocyanine

Travkin¹,

Fedoseev²,

Sachkov³

et al. 2019

MHC

Self Cite

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The effect of titanyl phthalocyanine TiOPc in the methylammonium lead triiodide (MAPbI 3) perovskite based solar cells is studied. The photovoltaic output of cells at low intensity illumination with l max = 840 nm is greatly enhanced when using TiOPc as a NIR-absorbing hole conductor. Compared to the reference cells with a standard cuprous iodide CuI as a hole-transporting layer, the photocurrent increases by a factor of 15, so that the narrow-band power conversion efficiency (PCE) exceeds 2 %. It should be pointed out that the irradiation wavelength lies beyond the intrinsic absorption of MAPbI 3 or any other material in the device scheme except TiOPc. The improvement is associated with the photoactivity of TiOPc molecules in the near infrared region due to the largely splitted Q-band, as confirmed by the dependence of parameters on the polymorph transition in the TiOPc films.

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Direct Imaging of Current‐Induced Transformation of a Perovskite/Electrode Interface

Cited by 13 publications

References 37 publications

Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Secondary Ion Mass Spectrometry (SIMS) for Chemical Characterization of Metal Halide Perovskites

Investigating the Effects of Chemical Gradients on Performance and Reliability within Perovskite Solar Cells with TOF‐SIMS

NIR Photoresponse of Perovskite Solar Cells with Titanyl Phthalocyanine

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